Progress in Superconductivity and Cryogenics (한국초전도ㆍ저온공학회논문지)

The Korean Society of Superconductivity and Cryogenics (한국초전도저온학회)
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Degradation characteristics of 2G HTS tapes with respect to an electrical breakdown

  • Kang, Jong O (Department of Electrical Engineering, Korea National University of Transportation) ;
  • Lee, Onyou (Department of Electrical Engineering, Korea National University of Transportation) ;
  • Mo, Young Kyu (Department of Electrical Engineering, Korea National University of Transportation) ;
  • Kim, Junil (Department of Electrical Engineering, Korea National University of Transportation) ;
  • Bang, Seungmin (Department of Electrical Engineering, Korea National University of Transportation) ;
  • Lee, Hongseok (Department of Electrical Engineering, Korea National University of Transportation) ;
  • Lee, Jae-Hun (SuNAM Co., Ltd.) ;
  • Jang, Cheolyeong (SuNAM Co., Ltd.) ;
  • Kang, Hyoungku (Department of Electrical Engineering, Korea National University of Transportation)
  • Received : 2015.02.23
  • Accepted : 2015.03.19
  • Published : 2015.03.31
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Abstract

The electrical insulation design for a superconducting coil system is important for developing high voltage superconducting apparatuses. Also, the degraded characteristics of superconducting tapes due to an electrical breakdown should be considered for superconducting coils design. In this study, the degradation characteristics of 2G high temperature superconducting (HTS) tapes were studied with respect to electrical breakdown tests. The degradation tests of 2G HTS tapes were performed with various stabilizer materials. The degradation characteristics of 2G HTS tapes such as critical current(Ic) and index number were observed by performing electrical breakdown tests. It was found that the characteristics such as Ic and index number can be degraded by an electrical breakdown. Moreover, it was concluded that the degradation characteristics of 2G HTS tapes were affected by a stabilizer material and applied breakdown voltage. The cross sectional view of 2G HTS tapes was observed by using a scanning electron microscope (SEM). As results, it is found that the degradation characteristics of 2G HTS tapes are concerned with hardness and electrical resistivity of stabilizer layers.

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References

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