반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)

한국반도체디스플레이기술학회 (The Korean Society Of Semiconductor & Display Technology)
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전자 부품 검사용 광학분석 장비 제어시스템에 대한 연구

Study on the Optical Analysis Equipment Control System for Electronic Parts Inspection

  • 이준하 (상명대학교 컴퓨터공학과)
  • Lee, Jun Ha (Department of Computer Engineering, Sangmyung University)
  • 투고 : 2015.11.27
  • 심사 : 2015.12.21
  • 발행 : 2015.12.31
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초록

Product of technology developed in this study is an external interface for controlling the equipment of pendant key remote control system circuit board, and it is used in the electronic component test equipment system. Main control system module is in the role as a device for controlling the various control devices that make up the integrated system for microscopic examination at the request of the host computer engineers to control the inspection equipment. The pentane-key interface module to its role as a device for controlling the various control devices that make up the integrated system for microscopic examination at the request of the host computer for the engineer to control the inspection equipment. Development of the control system can be expected in the configuration of a system for efficient and accurate inspection of high-precision parts.

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참고문헌

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