한국정밀공학회지 (Journal of the Korean Society for Precision Engineering)

  • 제32권1호
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  • Pages.75-81
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  • 2015
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  • 1225-9071(pISSN)
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  • 2287-8769(eISSN)
한국정밀공학회 (Korean Society for Precision Engineering)
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광선추적법을 이용한 비파괴 내부 결함 모델 및 해석

Modeling and Analysis of a Ray Tracing Method for Non-Destructive Testing for Internal Defects

  • 김택구 (서울과학기술대학교 NID융합기술대학원) ;
  • 김주한 (서울과학기술대학교 기계.자동차공학과)
  • Kim, Teak Gu (Graduate School of NID Fusion Technology, Seoul National University of Science and Technology) ;
  • Kim, Joohan (Department of Mechanical and Automotive Engineering, Seoul National University of Science and Technology)
  • 투고 : 2014.10.10
  • 심사 : 2014.12.02
  • 발행 : 2015.01.01
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초록

Modeling and analysis using a ray tracing method for internal defects were described. Reflection and refraction of rays on the interface of defects were modeled using the Harvey model and the Lambertian model. The diffraction on the interface of defects affected the incoming signals and it could evaluate any defects in the matter and its signal would be analyzed with the ray tracing simulation. The simulation results were compared with actual detecting signals and the ray tracing model was shown in good agreement with experimental data. This method has a possibility to be used as wave propagation modeling in non-destructive testing.

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참고문헌

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