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알루미늄 에치피트에 ZrO2 막의 졸-겔 코팅 및 양극산화 특성

Sol-gel Coating of ZrO2 Film in Aluminium Etch Pit and Anodizing Properties

  • ;
  • 박상식 (경북대학교 나노소재공학부)
  • Chen, Fei (School of Nano Materials Engineering, Kyungpook National University) ;
  • Park, Sang-Shik (School of Nano Materials Engineering, Kyungpook National University)
  • 투고 : 2014.03.28
  • 심사 : 2014.04.28
  • 발행 : 2014.05.27

초록

$ZrO_2$ films were coated on aluminum etching foil by the sol-gel method to apply $ZrO_2$ as a dielectric material in an aluminum(Al) electrolytic capacitor. $ZrO_2$ films annealed above $450^{\circ}C$ appeared to have a tetragonal structure. The withdrawal speed during dip-coating, and the annealing temperature, influenced crack-growth in the films. The $ZrO_2$ films annealed at $500^{\circ}C$ exhibited a dielectric constant of 33 at 1 kHz. Also, uniform $ZrO_2$ tunnels formed in Al etch-pits $1{\mu}m$ in diameter. However, $ZrO_2$ film of 100-200 nm thickness showed the withstanding voltage of 15 V, which was unsuitable for a high-voltage capacitor. In order to improve the withstanding voltage, $ZrO_2$-coated Al etching foils were anodized at 300 V. After being anodized, the $Al_2O_3$ film grew in the directions of both the Al-metal matrix and the $ZrO_2$ film, and the $ZrO_2$-coated Al foil showed a withstanding voltage of 300 V. However, the capacitance of the $ZrO_2$-coated Al foil exhibited only a small increase because the thickness of the $Al_2O_3$ film was 4-5 times thicker than that of $ZrO_2$ film.

키워드

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피인용 문헌

  1. Coated Al Foil for High Voltage Capacitor vol.24, pp.2, 2015, https://doi.org/10.5757/ASCT.2015.24.2.33