Journal of Electrical Engineering and Technology

  • 제8권4호
  • /
  • Pages.840-849
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  • 2013
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  • 1975-0102(pISSN)
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  • 2093-7423(eISSN)
대한전기학회 (The Korean Institute of Electrical Engineers)
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Statistical Analysis of Electrical Tree Inception Voltage, Breakdown Voltage and Tree Breakdown Time Data of Unsaturated Polyester Resin

  • Ahmad, Mohd Hafizi (Institute of High Voltage and High Current, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, UTM) ;
  • Bashir, Nouruddeen (Institute of High Voltage and High Current, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, UTM) ;
  • Ahmad, Hussein (Institute of High Voltage and High Current, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, UTM) ;
  • Piah, Mohamed Afendi Mohamed (Institute of High Voltage and High Current, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, UTM) ;
  • Abdul-Malek, Zulkurnain (Institute of High Voltage and High Current, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, UTM) ;
  • Yusof, Fadhilah (Dept. of Mathematics, Faculty of Science, Universiti Teknologi Malaysia)
  • 투고 : 2012.07.03
  • 심사 : 2013.04.08
  • 발행 : 2013.07.01
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초록

This paper presents a statistical approach to analyze electrical tree inception voltage, electrical tree breakdown voltage and tree breakdown time of unsaturated polyester resin subjected to AC voltage. The aim of this work was to show that Weibull and lognormal distribution may not be the most suitable distributions for analysis of electrical treeing data. In this paper, an investigation of statistical distributions of electrical tree inception voltage, electrical tree breakdown voltage and breakdown time data was performed on 108 leaf-like specimen samples. Revelations from the test results showed that Johnson SB distribution is the best fit for electrical tree inception voltage and tree breakdown time data while electrical tree breakdown voltage data is best suited with Wakeby distribution. The fitting step was performed by means of Anderson-Darling (AD) Goodness-of-fit test (GOF). Based on the fitting results of tree inception voltage, tree breakdown time and tree breakdown voltage data, Johnson SB and Wakeby exhibit the lowest error value respectively compared to Weibull and lognormal.

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참고문헌

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