Journal of Korean Institute of Industrial Engineers (대한산업공학회지)

Korean Institute of Industrial Engineers (대한산업공학회)
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A Novelty Detection Algorithm for Multiple Normal Classes : Application to TFT-LCD Processes

다중 정상 하에서 단일 클래스 분류기법을 이용한 이상치 탐지 : TFT-LCD 공정 사례

  • Joo, Tae Woo (School of Industrial Management Engineering, Korea University) ;
  • Kim, Seoung Bum (School of Industrial Management Engineering, Korea University)
  • 주태우 (고려대학교 산업경영공학과) ;
  • 김성범 (고려대학교 산업경영공학과)
  • Received : 2012.11.15
  • Accepted : 2013.03.06
  • Published : 2013.04.15
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Abstract

Novelty detection (ND) is an effective technique that can be used to determine whether a future observation is normal or not. In the present study we propose a novelty detection algorithm that can handle a situation where the distributions of target (normal) observations are inhomogeneous. A simulation study and a real case with the TFT-LCD process demonstrated the effectiveness and usefulness of the proposed algorithm.

Keywords

References

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