JSTS:Journal of Semiconductor Technology and Science

  • 제13권1호
  • /
  • Pages.43-47
  • /
  • 2013
  • /
  • 1598-1657(pISSN)
  • /
  • 2233-4866(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
권호 표지
DOI QR코드

DOI QR Code

Characterization of Density-of-States in Polymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator

  • Kim, Jaehyeong (School of Electrical Engineering, Kookmin University) ;
  • Jang, Jaeman (School of Electrical Engineering, Kookmin University) ;
  • Bae, Minkyung (School of Electrical Engineering, Kookmin University) ;
  • Lee, Jaewook (School of Electrical Engineering, Kookmin University) ;
  • Kim, Woojoon (School of Electrical Engineering, Kookmin University) ;
  • Hur, Inseok (School of Electrical Engineering, Kookmin University) ;
  • Jeong, Hyun Kwang (School of Electrical Engineering, Kookmin University) ;
  • Kim, Dong Myong (School of Electrical Engineering, Kookmin University) ;
  • Kim, Dae Hwan (School of Electrical Engineering, Kookmin University)
  • 투고 : 2012.04.30
  • 발행 : 2013.02.28
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

In this work, we report extraction of the density-of-states (DOS) in polymer-based organic thin film transistors through the multi-frequency C-V spectroscopy. Extracted DOS is implemented into a TCAD simulator and obtained a consistent output curves with non-linear characteristics considering the contact resistance effect. We employed a Schottky contact model for the source and drain to fully reproduce a strong nonlinearity with proper physical mechanisms in the output characteristics even under a very small drain biases. For experimental verification of the model and extracted DOS, 2 different OTFTs (P3HT and PQT-12) are employed. By controlling the Schottky contact model parameters in the TCAD simulator, we accurately reproduced the nonlinearity in the output characteristics of OTFT.

키워드

참고문헌

  1. J. Jang, et al., "Extraction of the sub-bandgap density-of-states in polymer thin-film transistors with the multi-frequency capacitance-voltage spectroscopy," Appl. Phys. Lett. Vol.100, No.13 (2012), p.133506-133506-5 https://doi.org/10.1063/1.3698455
  2. G. B. Blanchet, et al., "Contact resistance in organic thin film transistors," Appl. Phys. Lett. Vol. 84, No.2 (2004), p.296-298 https://doi.org/10.1063/1.1639937
  3. C. R. Crowell, et al., "CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS," Solid-State Electronics, Vol.9, (1966), p.1035-1048. https://doi.org/10.1016/0038-1101(66)90127-4
  4. ATLAS Device simulation software User's Manual, SILVACO International.

피인용 문헌

  1. Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors vol.35, pp.3, 2014, https://doi.org/10.1109/LED.2014.2298861