참고문헌
- Y. Xu, L. Cheng and L. Zhang, et al., Mater. Sci. Eng., 300, 196 (2001). https://doi.org/10.1016/S0921-5093(00)01533-1
- Y. Yin, J. G. Binner and T. E. Cross, et al., J. Mater. Sci., 29, 2250 (1994). https://doi.org/10.1007/BF01154706
- L. R. Zhao and B. Z. Jang, J. Mater. Sci., 32, 2811 (1997). https://doi.org/10.1023/A:1018612214572
- Y. Yin, J. G. Binner, T. E. Cross, et al., J. Mater. Sci., 29, 2250 (1994). https://doi.org/10.1007/BF01154706
- Y. Q. Wang, B. L. Zhou and Z. M. Wang, Carbon, 33(4), 427 (1995). https://doi.org/10.1016/0008-6223(94)00167-X
- T. Piquero, H. Vincent, C. Vincent and J. Bouix, Carbon, 33(4), 455 (1995). https://doi.org/10.1016/0008-6223(94)00170-5
- K. Kusakabe, B. K. Sea, J. I. Hayashi, H. Maeda and S. Morooka, Carbon, 34(2), 179 (1996). https://doi.org/10.1016/0008-6223(96)00166-2
- K. L. Choy, Prog. Mater. Sci., 48(2), 57 (2003). https://doi.org/10.1016/S0079-6425(01)00009-3
- G. Hackl, H. Gerhard and N. Popovska, Thin Solid Films, 513(1-2), 217 (2006). https://doi.org/10.1016/j.tsf.2006.02.001
- Y. J. Lee, Diam. Relat. Mat., 13(3), 383 (2004). https://doi.org/10.1016/j.diamond.2003.11.062
- T. Shimoo, K. Okamura, T. Akizuki and M. Take mura, J. Mater. Sci., 30(13), 3387 (1995). https://doi.org/10.1007/BF00349884
- G. Emig, N. Popovska and G. Schoch, Thin Solid Films, 241, 361 (1993).
- K. Kusakabe, B. Sea, J. Hayashi, H. Maeda and S. Morooka, Carbon, 34(2), 179 (1996). https://doi.org/10.1016/0008-6223(96)00166-2
- G. Emig, N. Popovska and G. Schoch, Thin Solid Films, 241, 361 (1993).
- T. Piquero, H. Vincent, C. Vincent and J. Bouix, Carbon, 33(4), 455 (1995). https://doi.org/10.1016/0008-6223(94)00170-5
- Y. Wang, Z. Wang, B. Zhou and C. Shi, J. Mater. Sci. Lett., 12, 817 (1993). https://doi.org/10.1007/BF00277983
- G. Hackl, H. Gerhard and N. Popovska, Thin Solid Films, 513, 217 (2006). https://doi.org/10.1016/j.tsf.2006.02.001
- Y. Wang, B. Zhou and Z. Wang, Carbon, 33(4), 427 (1995). https://doi.org/10.1016/0008-6223(94)00167-X
- W. Xie, Z. Mirza, G. Mobus, and S. Zhang, J. Am. Ceram. Soc., 95(6), 1878 (2012). https://doi.org/10.1111/j.1551-2916.2012.05153.x
- J. Schlichting, Powder Metall. Int., 12(3-4), 141 (1980).
- D. P. Stinton, W. J. Lackey, R. J. Lauf and T. M. Besmann, Ceram. Eng. Sci. Proc., 5, 668 (1984). https://doi.org/10.1002/9780470320228.ch21
- K. Minato and K. Fukuda, J. Mater. Sci., 23, 699 (1988). https://doi.org/10.1007/BF01174708
- D. Lespiaux, F. Langlasis and R. Naslain, J. Mater. Sci., 30, 1550 (1995).
- W. J. Lackey, J. A. Hanigofsky, G. B. Freeman, R. D. Hardin and A. Prasad, J. Am. Ceram. Soc., 78, 1564 (1995). https://doi.org/10.1111/j.1151-2916.1995.tb08852.x
- H. O. Pierson, Handbook of Chemical Vapor Deposition, 2nd Edition: Principles, Technology and Applications, (2nd edition, Noyes, New York, 1992), Chap. 9.
- Powder diffraction file, Joint Committee on Powder Diffraction Standard, Card 12-0212.
- M. G. So and J. S. Chun, J. Vac. Sci. Technol. A, 6(1), 5 (1988). https://doi.org/10.1116/1.574969
- C. Li, L. Huang, G. P. Snigdha, Y. Yu and L. Cao, ACS Nano, 6(10), 8868 (2012). https://doi.org/10.1021/nn303745e