Polymer Science and Technology (한국고분자학회지:고분자과학과기술)

The Polymer Society of Korea (한국고분자학회)
권호 표지

Characterization of Polymer Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

비행시간형 이차이온질량분석(TOF-SIMS) 장비를 이용한 고분자 표면분석 및 최근동향

  • Lee, Yeonhee (Advanced Analysis Center, Korea Institute of Science and Technology) ;
  • Lee, Jihye (Advanced Analysis Center, Korea Institute of Science and Technology)
  • Published : 2013.10.25
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Abstract

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