Journal of Power Electronics

The Korean Institute of Power Electronics (전력전자학회)
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Electrical Characteristics and Thermal Reliability of Stacked-SCRs ESD Protection Device for High Voltage Applications

  • Koo, Yong Seo (Dept. of Electronics and Electrical Eng., Dankook University) ;
  • Kim, Dong Su (Dept. of Electronics and Electrical Eng., Dankook University) ;
  • Eo, Jin Woo (Dept. of Electronics and Electrical Eng., Dankook University)
  • Received : 2012.04.13
  • Published : 2012.11.20
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Abstract

The latch-up immunity of the high voltage power clamps used in high voltage ESD protection devices is very becoming important in high-voltage applications. In this paper, a stacking structure with a high holding voltage and a high failure current is proposed and successfully verified in 0.18um CMOS and 0.35um BCD technology to achieve the desired holding voltage and the acceptable failure current. The experimental results show that the holding voltage of the stacking structure can be larger than the operation voltage of high-voltage applications. Changes in the characteristics of the stacking structure under high temperature conditions (300K-500K) are also investigated.

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References

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  1. A Novel High Latch-Up Immunity Electrostatic Discharge Protection Device for Power Rail in High-Voltage ICs vol.16, pp.2, 2016, https://doi.org/10.1109/TDMR.2016.2544350