Transactions on Electrical and Electronic Materials

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Conducting Polymer Material Characterization Using High Frequency Planar Transmission Line Measurement

  • Cho, Young-Seek (Division of Electrical Information Communication Engineering, Wonkwang University) ;
  • Franklin, Rhonda R. (Department of Electrical and Computer Engineering, University of Minnesota)
  • Received : 2012.06.18
  • Accepted : 2012.07.31
  • Published : 2012.10.25
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Abstract

A conducting polymer, poly 3-hexylthiophene (P3HT) is characterized with the metal-insulator-semiconductor (MIS) measurement method and the high frequency planar circuit method. From the MIS measurement method, the relative dielectric constant of the P3HT film is estimated to be 4.4. For the high frequency planar circuit method, a coplanar waveguide is fabricated on the P3HT film. When applying +20 V to the CPW on P3HT film, the P3HT film is in accumulation mode and becomes lossy. The CPW on P3HT film is 1.5 dB lossier than the CPW on $SiO_2$ film without P3HT film at 50 GHz.

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