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Study on Poly(3,4-ethylenedioxythiophene) Thin Film Vapour Phase-Polymerized with Iron(III)Tosylate on High Quality 3-Aminopropyltriethoxysilane Self-Assembled Monolayer

  • Choi, Sangil (Department of Nano-Polymer Materials Engineering, Pai Chai University) ;
  • Kim, Wondae (Department of Nano-Polymer Materials Engineering, Pai Chai University) ;
  • Cho, Sung Jun (Department of Nano-Polymer Materials Engineering, Pai Chai University) ;
  • Kim, Sungsoo (Department of Nano-Polymer Materials Engineering, Pai Chai University)
  • Received : 2012.12.10
  • Accepted : 2012.12.21
  • Published : 2012.09.30

Abstract

In this study, PEDOT thin films polymerized with Iron(III)tosylate ($Fe(PTS)_3$) and grown on atomically smooth and highly dense 3-aminopropyltriethoxysilane self-assembled monolayer (APS-SAM) surfaces by VPP method have been investigated. PEDOT thin films were synthesized on APS self-assembled $SiO_2$ wafer surface at two different concentrations (20 wt% and 40 wt%) and growth time (3 and 30 minutes), and then their sheet resistance were measured and compared. PEDOT thin films grown with 20 wt% $Fe(PTS)_3$ oxidant are highly conductive when compared with the film grown with 40 wt% $Fe(PTS)_3$, as ascertained by the measured sheet resistance values down to 0.06 ${\Omega}/cm$. It clearly suggests that 20 wt% is more effective oxidant concentration for VPP than 40 wt% even though the film grown with 40 wt% oxidant has better quality than the film with 20 wt% $Fe(PTS)_3$ does.

Keywords

References

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