A Study on Method for Classifying Quality Levels of Commercial Electric & Electronic Parts

상용 전기전자 부품의 품질등급 적용 방안에 관한 연구

  • Jeong, Da-Un (Maintenance Technology Research Center, Consolidated Maintenance Depot, ROK Army) ;
  • Yun, Hui-Sung (Maintenance Technology Research Center, Consolidated Maintenance Depot, ROK Army) ;
  • Kwak, Cho-Rong (Maintenance Technology Research Center, Consolidated Maintenance Depot, ROK Army) ;
  • Lee, Seung-Hun (Maintenance Technology Research Center, Consolidated Maintenance Depot, ROK Army) ;
  • Hur, Man-Og (Maintenance Technology Research Center, Consolidated Maintenance Depot, ROK Army)
  • 정다운 (육군 종합정비창 정비기술연구소) ;
  • 윤희성 (육군 종합정비창 정비기술연구소) ;
  • 곽초롱 (육군 종합정비창 정비기술연구소) ;
  • 이승헌 (육군 종합정비창 정비기술연구소) ;
  • 허만옥 (육군 종합정비창 정비기술연구소)
  • Received : 2011.08.11
  • Accepted : 2012.03.03
  • Published : 2012.03.25

Abstract

The quality of a part has directly effect on part reliability. In the basis of MIL-HDBK-217F model, it is the determined rule that part's quality level should follow its nominal one written in its specification. If quality information is unknown, quality level of the part should be determined as 'Lower'. However, the prediction model is said to be short in reflecting parts applying 'state-of-the-art' technology and result in over-estimated failure rate by some reliability-related authorities or research institutes. In this study, the reliability prediction results by the model of MIL-HDBK-217F and Telcordia SR-332 are compared and analyzed to verify whether the statement is reasonable or not.

Keywords

References

  1. Department of Defense(1991), MIL-HDBK-217F, Reliability Prediction for Electronic Equipment.
  2. Department of Defense(2005), MIL-STD-690D, Failure Rate Sampling Plans and Procedures.
  3. Department of Defense(2005), DoD Guide For Achieving Reliability, Availability, And maintainability "System Engineering for Mission Sucess".
  4. Department of Defense(2006), MIL-STD-750E, Test Method for Semiconductor Devices.
  5. Department of Defense(2010), MIL-STD-883H, Test Method Standard Microcircuits.
  6. Department of Defense(2010), MIL-PRF-19500P, Semiconductor Devices, General Specification for.
  7. Department of Defense(2010), MIL-PRF-38535J, Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
  8. Marcel Held, Urs Sennhauser(2004), Failure Rate Prediction Models used for Reliability Monitoring of Electronic Systems, Electronics Goes Green, 939-944.
  9. Telcordia Technologies(2001), Telcordia Technologies Special Report SR-332 Issue 1, Reliability Prediction Procedure for Electronic Equipment.
  10. William Denson (1998), The History of Reliability Prediction, IEEE Transactions on reliability, VOL. 47, NO. 3, 321-328