Journal of Applied Reliability (한국신뢰성학회지:신뢰성응용연구)

The Korean Reliability Society (한국신뢰성학회)
권호 표지

Analysis for luminescence property about an increase quantity of silicate phosphor and reliability

Silicate 형광체 증가에 대한 발광 특성 및 신뢰성 분석

  • Yoon, Yanggi (Reliability Assessment Team, Korea Testing Certification) ;
  • Jang, Joongsoon (Department of Industrial Engineering, Ajou University)
  • 윤양기 (한국기계전기전자시험연구원) ;
  • 장중순 (아주대학교 산업정보시스템공학부)
  • Received : 2012.07.27
  • Accepted : 2012.12.14
  • Published : 2012.12.25
Download PDF
⟨ Previous Next ⟩

Abstract

This paper presents a changes of luminescence property for converted white LEDs with the commercially available silicate phosphor. If silicate phosphor's quantity increase step by step. luminescence property will be changing. we analyze luminescence property for these change and carry out the high temperature aging test for 7,000 hours, the high temperature and humidity aging test for 7,000 hours for reliability. LED degradation not only results in reduced light output but also in color changes. so we monitor correlated color temperature (CCT), chromaticity coordinates(x, y) and spectrum intensity. Those results suggest that humidity factor more bad effect in color changes than temperature factor and Lighting quality is related with quantity of phosphor.

Keywords

References

  1. 김창해(2008), 백색 LED용 형광 소재의 연구 개발 동향, 물리학과 첨단 기술, pp.22-25.
  2. 박윤형(2005), Silicate 계열의 LED용 백생 발광 소자에 대한 광학적 특성 연구.
  3. 신무환-김재필(2009), LED 패키징기술 입문, pp.227.
  4. 천성일 외 (2010), 고출력 형광체 변환 백색 LED 패키지의 가속 시험, 신뢰성응용연구, 제10권, 제2호, pp.137-148.
  5. Alliance for Solid-State Illumination System and Technologies of Lighting Research Center(2006), "LED Life for General Lighting", Lighting Research Center, New York.
  6. Calleja, A.J., Tones, A., Garcia, J., Secades, M.R., Ribas, J., Martinez, J.A.(2007), "Evaluation of Power LEDs Drivers with Supercapacitors and Digital Control", 42nd IEEE Industry Applications Conference, pp.1129-1134.
  7. Hsu, Y. C., Lin, Y. K, Chen, M. M., Tsai, C. C., Kuang, J. H., Husng S. S., Hu, H. L., Su, Y. I., Cheng, W. H.(2008), "Failure Mechanism Associated With Lens Shape of High Power LED Modules in Aging Test", IEEE T. Electron Dev. 55(2), pp.689-694.
  8. Ishizaki, S., Kimura, H., Sugimoto, M.(2007), "Lifetime Estimation of High Power White LEDs", Journal of Light and Visual Environment. Vol. 31.
  9. Liu, Z., Liu, S., Wang, K., Luo, X.(2009), "Optical Analysis of Phosphor's Location for High-Power Light-Emitting Diodes", IEEE T. Device Mat. Re., 9(1), pp.65-73.
  10. Rong-Jun Xie, Yuan Qiang Li, Naoto Hirosaki, Hajime Yamamoto(2011), "Nitride Phosphors and sloid-State Lighting", CRC Press, 87.
  11. Tan, C.M., Eric Chen, B.K., Xu, G., Liu, Y.(2009), "Analysis of Humidity Effects on the Degradation of High-Power White LEDs", Microelectronics Reliability Vol. 49., pp.1226-1230. https://doi.org/10.1016/j.microrel.2009.07.005
  12. Trevisanello, L., Meneghini, M., Mura, G. , Vanzi, M., Pavesi, M., Meneghesso, G. and Zanoni, E.(2008), "Accelerated Life Test of High Brightness Light Emitting Diodes", IEEE Transactions on Device and Materials Reliability, Vol. 8, No. 2. pp.304-311.
  13. Tsai, C. C., Wang, J., Chen, M. H., Hsu, Y. C., Lin, Y. J., Lee, C. W., Huang, S. B., Hu, H. L., Cheng, W. H.(2009), "Investigation of Ce:YAG Doping Effect on Thermal Aging for High Power Concerted White Light Emitting Diodes", IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 3, pp.367-371.
  14. Volker Bachmann, Cees Ronda, Andries Meijerink(2009), "Temperature Quenching of Yellow Ce3+ Luminescence in YAG:Ce", Chem. Mater. 21, pp.2077-2084. https://doi.org/10.1021/cm8030768