Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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Atomic Resolution Imaging of Rotated Bilayer Graphene Sheets Using a Low kV Aberration-corrected Transmission Electron Microscope

  • Ryu, Gyeong Hee (School of Mechanical and Advanced Materials Engineering, Ulsan National Institute of Science and Technology (UNIST)) ;
  • Park, Hyo Ju (School of Mechanical and Advanced Materials Engineering, Ulsan National Institute of Science and Technology (UNIST)) ;
  • Kim, Na Yeon (School of Mechanical and Advanced Materials Engineering, Ulsan National Institute of Science and Technology (UNIST)) ;
  • Lee, Zonghoon (School of Mechanical and Advanced Materials Engineering, Ulsan National Institute of Science and Technology (UNIST))
  • Received : 2012.11.30
  • Accepted : 2012.12.04
  • Published : 2012.12.31
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Abstract

Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic configuration of bilayer graphene with a rotation angle can be identified from the direct imaging and phase reconstructed imaging since atomic resolution Moir$\acute{e}$ pattern can be obtained successfully at atomic scale using an aberration-corrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic configuration of stacked graphene layers readily.

Keywords

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