Acknowledgement
Supported by : Hoseo University
References
- Y. Yoshizawa, S. Oguma, and K. Yamauchi, J. Appl. Phys. 64, 6044 (1988). https://doi.org/10.1063/1.342149
- L. N. Kotov, V. K. Turkov, and V. S. Vlasov, J. Mag. & Mag. Mater. 316, 20 (2007). https://doi.org/10.1016/j.jmmm.2007.02.014
- N. Hasegawa, M. Saito, N. Kataoka, and H. Fujimori, J. Mater. Eng. & Perform. 2, 181 (1993). https://doi.org/10.1007/BF02660284
- H. T. Kim, S. J. Kim, S. H. Han, H. J. Kim, and I. K. Kang, IEEE Trans. Mag. 31, 4100 (1995). https://doi.org/10.1109/20.489874
- R. Schwarz, M. Fernandes, and J. Martins : Sensors and actuators. A, Physical. 115, 331 (2004). https://doi.org/10.1016/j.sna.2004.03.074
- Z. Yuan, J. Shi, and B. Xu, Plasma Sci. & Tech. 10, 446 (2008). https://doi.org/10.1088/1009-0630/10/4/09
- M. A. Russak, C. V. Jahnes, E. Klokholm, J. W. Lee, M. E. Re, and B. C. Webb, J. Appl. Phys. 70, 6427 (1991). https://doi.org/10.1063/1.349918
- Y. Hoshi and M. Naoe, IEEE Trans. Mag. 26, 2341 (1990). https://doi.org/10.1109/20.104717
- R. E. Jones, Jr., J. Lo, and J. L. Williams, IEEE Trans. Mag. 29, 3072 (1993). https://doi.org/10.1109/20.280895
- S. Wang and M. H. Kryder, J. Appl. Phys. 69, 5625 (1991). https://doi.org/10.1063/1.347943
- C. H. Bae, S. O. Han, and C. S. Han, Kor. J. Met. Mater. 48, 268 (2010). https://doi.org/10.3365/KJMM.2010.48.03.268
- S. Yaegashi, T. Kurihara, and K. Satoh, J. Appl. Phys. 81, 6303 (1997). https://doi.org/10.1063/1.364365
- C. K. Jung, S. H. Jeong, Y. M. Chung, J. G. Han, and J. H. Boo, Met. Mater. -Int. 13, 463 (2007). https://doi.org/10.1007/BF03027903
- G. S. Lee, I. S. Park, G. A. Lee, M. C. Kim, and S. H. Jang, J. Kor. Inst. Met. & Mater. 41, 786 (2003).