Transactions on Electrical and Electronic Materials

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

The Structural-Dependent Characteristics of Rashba Spin Transports in In0.5Ga0.5As/In0.5Al0.5As Heterojunctions

  • Received : 2011.04.25
  • Accepted : 2011.06.02
  • Published : 2011.08.25
Download PDF
⟨ Previous Next ⟩

Abstract

The growth and characterization of $In_{0.5}Ga_{0.5}As/In_{0.5}Al_{0.5}As$ narrow-gap inverted high electron mobility transistor structures, developed as a candidate material for spin-injection devices, are presented in this study. We have grown samples possessing surface $In_{0.5}Ga_{0.5}As$ channels of different thicknesses (30 nm and 60 nm) both with and without a thin 3 nm $In_{0.5}Ga_{0.5}As$ cap layer by using molecular beam epitaxy. We then investigated the in-plane transport properties as well as the Rashba spin-orbit coupling constant of the two-dimensional electron gas confined at the heterojunction interface.

Keywords

References

  1. S. Datta and B. Das, Appl. Phys. Lett. 56, 665 (1990) [DOI: 10.1063/1.102730].
  2. J. Nitta, T. Akazaki, H. Takayanagi, and T. Enoki, Phys. Rev. Lett. 78, 1335 (1997) [DOI: 10.1103/PhysRevLett.78.1335]
  3. G. Engels, J. Lange, Th. Schapers, and H. Luth, Phys. Rev. B 55, R1958 (1997) [DOI: 10.1103/PhysRevB.55.R1958].
  4. T. Schapers, G. Engels, J. Lange, T. Klocke, M. Hollfelder, and H. Luth, J. Appl. Phys. 83, 4324 (1998) [DOI: 10.1063/1.367192].
  5. Y. Sato, T. Kita, S. Gozu, and S. Yamada, J. Appl. Phys. 89, 8017 (2001) [DOI: 10.1063/1.1362356].
  6. T. Kita, Y. Sato, S. Gozu, and S. Yamada, Physica B: Condens. Matter 298, 65 (2001) [DOI: 10.1016/s0921-4526(01)00261-7].
  7. W. Walukiewicz, H. E. Ruda, J. Lagowski, and H. C. Gatos, Phys. Rev. B 30, 4571 (1984) [DOI: 10.1103/PhysRevB.30.4571].
  8. Th. Schapers, J. Nitta, H. B. Heersche, and H. Takayanagi, Phys. Rev. B 64, 125314 (2001) [DOI: 10.1103/PhysRevB.64.125314].
  9. S. V. Iordanskii, Yu. B. Lyanda-Geller, and G. E. Pikus, JETP Lett. 60, 206 (1994).