DOI QR코드

DOI QR Code

Monte Carlo Simulation on Reliability of a Self-Separable Ejector for Man-Portable Missiles

  • Lee, Hyo-Nam (Rocket Propulsion Directorate, Agency for Defense Development) ;
  • Oh, Jong-Yun (Rocket Propulsion Directorate, Agency for Defense Development)
  • Received : 2011.08.19
  • Accepted : 2011.12.07
  • Published : 2011.12.30

Abstract

An ejector was developed for man-portable missiles. The ejector can be separated from the missile after the completion of the ejection function even without any additional separation devices. This paper introduces the particular separation mechanism of the ejector and presents the methodology, based on a probabilistic design method, to predict the ejection-and-separation reliability. This approach using Monte Carlo simulation can also be applicable to the reliability prediction of one-shot items suffering from difficulties in estimating or in demonstrating their reliability due to the lack of the number of tests available.

Keywords

References

  1. Johnson, R. A. (1988). Stress-strength models for reliability. In P. R. Krishnaiah and C. R. Rao, eds. Handbook of Statistics, Vol 7: Quality Control and Reliability. Amsterdam: North-Holland. pp. 27-54.
  2. Kececioglu, D. (2003). Robust Engineering Design-by-Reliability with Emphasis on Mechanical Components & Structural Reliability, Vol. 1. Lancaster: DEStech Publications. pp. 1-67.
  3. Perkins, D. and Fragola, J. (1989). Propulsion reliability-an historical perspective. Proceedings of the 25th AIAA/ASME/SAE/ASEE Joint Propulsion Conference, Monterey, CA. AIAA-1989-2623.
  4. Rubinstein, R. Y. (1981). Simulation and the Monte Carlo Method. New York: Wiley. pp. 114-157.
  5. Sutton, G. P. (1992). Rocket Propulsion Elements: An Introduction to the Engineering of Rockets. 6th ed. New York: Wiley. p. 59.
  6. Wood, B. B. (1983). Bayesian Reliability Test Plans for One- Shot Devices [USAFA TR-84-01]. US Air Force Academy.
  7. Zhang, W. and Shiue, W. K. (2001). General reliability test plans for one-shot devices. In H. Pham, ed. Recent Advances in Reliability and Quality Engineering. Singapore: World Scientific. pp. 51-60.