DOI QR코드

DOI QR Code

An Optimal Scrubbing Scheme for Auto Error Detection & Correction Logic

자가 복구 오류 검출 및 정정 회로 적용을 고려한 최적 스크러빙 방안

  • 류상문 (군산대학교 제어로봇공학과)
  • Received : 2011.08.20
  • Accepted : 2011.09.25
  • Published : 2011.11.01

Abstract

Radiation particles can introduce temporary errors in memory systems. To protect against these errors, so-called soft errors, error detection and correcting codes are used. In addition, scrubbing is applied which is a fundamental technique to avoid the accumulation of soft errors. This paper introduces an optimal scrubbing scheme, which is suitable for a system with auto error detection and correction logic. An auto error detection and correction logic can correct soft errors without CPU's writing operation. The proposed scrubbing scheme leads to maximum reliability by considering both allowable scrubbing load and the periodic accesses to memory by the tasks running in the system.

Keywords

References

  1. S. Karp and B. K. Gilbert, "Digital system design in the presence of single event upsets," IEEE Trans. Aerospace and Electronic Systems, vol. 29, no. 2, pp. 310-316, Apr. 1993. https://doi.org/10.1109/7.210069
  2. R. Harboe-Sorensen, E. Daly, F. Teston, H. Schweitzer, R. Nartallo, P. Perol, F. Vandenbussche, H. Dzitko, and J. Cretolle, "Observation and analysis of single event effects on-board the SOHO satellite," IEEE Trans. Nuclear Science, vol. 49, no. 3, pp. 1345-1350, Jun. 2002. https://doi.org/10.1109/TNS.2002.1039665
  3. A. Taber and E. Normand, "Single event upset in avionics," IEEE Trans. Nuclear Science, vol. 40, no. 2, pp. 120-126, Apr. 1993. https://doi.org/10.1109/23.212327
  4. E. Normand, "Single event upset at ground level," IEEE Trans. Nuclear Science, vol. 43, no. 6, pp. 2742-2750, Dec. 1996. https://doi.org/10.1109/23.556861
  5. R. Morelos-Zaragoza, The Art of Error Correcting Coding, Wiley, 2002.
  6. A. M. Saleh, J. J. Serrano, and J. H. Patel, "Reliability of scrubbing recovery-techniques for RAMs," IEEE Trans. Reliability, vol. 39, no. 1, pp. 114-122, Apr. 1990. https://doi.org/10.1109/24.52622
  7. G. C. Yang, "Reliability of semiconductor RAMs with softerror scrubbing techniques," IEE Proc. in Computers and Digital Techniques, vol. 142, pp. 337-344, Sep. 1995. https://doi.org/10.1049/ip-cdt:19952162
  8. R. M. Goodman and M. Sayano, "The reliability of semiconductor RAM memories with on-chip error-correction coding," IEEE Trans. Information Theory, vol. 37, no. 3, pp. 884-896, May. 1991. https://doi.org/10.1109/18.79957
  9. P. Reviriego, J. A. Maestro, and S. H. Baeg, "Optimizing scrubbing sequences for advanced computer memories," IEEE Trans. Device and Materials Reliability, vol. 10, no. 2, pp. 192- 200, Jun. 2010. https://doi.org/10.1109/TDMR.2009.2039481
  10. S.-M. Ryu and D.-J. Park, "Transient bit error recovery scheme for ROM-based embedded systems," IEICE Trans. Information and System, vol. EE88-D, no. 9, pp. 2209-2212, Sep. 2005.
  11. S. Baeg, S. Wen, and R. Wong, "Minimizing soft errors in TCAM devices: a probabilistic approach to determining scrubbing intervals," IEEE Trans. Circuits and Systems, vol. 57, no. 4, pp. 814-822, Apr. 2010. https://doi.org/10.1109/TCSI.2009.2025856
  12. Z. Ming, X. L. Yi, L. Chang, and Z. J. Wei, "Reliability of memories protected by multibit error correction codes against MBUs," IEEE Trans. Nuclear Science, vol. 58, no. 1, pp. 289- 295, Feb. 2011. https://doi.org/10.1109/TNS.2010.2099667
  13. E. K. P. Chong and S. H. Zak, An Introduction to Optimization, John Wiley& Sons, 2001.

Cited by

  1. Response Time Optimization of DVR for 3-Phase Phase-Controlled Rectifier vol.19, pp.3, 2013, https://doi.org/10.5302/J.ICROS.2013.12.1835
  2. A New Hardening Technique Against Radiation Faults in Asynchronous Digital Circuits Using Double Modular Redundancy vol.20, pp.6, 2014, https://doi.org/10.5302/J.ICROS.2014.14.0006