과제정보
연구 과제 주관 기관 : 재료연구소
참고문헌
- S. Piazolo, V. G. Sursaeva, and D. J. Prior, Mater. Sci. Forum 495-497, 213 (2005). https://doi.org/10.4028/www.scientific.net/MSF.495-497.213
- N. Gao, S. C. Wang, H. S. Ubhi, and M. J. Starink, J. Mater. Sci. 40, 4971 (2005). https://doi.org/10.1007/s10853-005-3867-6
- V. Randle and O. Engler, Introduction to Texture Analysis: Macrotexture, Microtexture and Orientation Mapping, p.153-188, Taylor & Francis, London (2000).
- R. A. Schwarzer, D. P. Field, B. L. Adams, M. Kumar, and A. J. Schwartz, Electron Backscatter Diffraction in Materials Science, 2nd ed., p.1-20, Springer, New York (2009).
- A. K. Sikder, A. Kumar, P. Shukla, P. B. Zantye, and M. Sanganaria, J. Electron. Mater. 32, 1028 (2003). https://doi.org/10.1007/s11664-003-0085-3
- M. Hasegawa, Y. Nonaka, Y. Negishi, Y. Okinaka, and T. Osaka, J. Electrochem. Soc. 153, C117 (2006). https://doi.org/10.1149/1.2149299
- W. H. The, L. T. Koh, S. M. Chen, J. Xie, C. Y. Li, and P. D. Foo, Microelectron. J. 32, 579 (2001). https://doi.org/10.1016/S0026-2692(01)00035-0
- D. S. Liu, C. Y. Chen, and Y. C. Chao, J. Electron. Mater. 35, 958 (2006). https://doi.org/10.1007/BF02692554
- G. Liu, Y. Kuo, S. Ahmed, D. N. Buckley, and T. Tanaka- Ahmed, J. Electrochem. Soc. 155, H432 (2008). https://doi.org/10.1149/1.2904937
- H. D. Merchant, M. G. Minor, and Y. L. Liu, J. Electron. Mater. 28, 998 (1999). https://doi.org/10.1007/s11664-999-0176-x
- T. Hatano, Y. Kurosawa, and J. Miyake, J. Electron. Mater. 29, 611 (2000). https://doi.org/10.1007/s11664-000-0054-z
- K. J. Mirpuri and J. A. Szpunar, J. Electron. Mater. 34, 1509 (2005). https://doi.org/10.1007/s11664-005-0158-6
- K.-K. Mirpuri, H. Wendrock, K. Wetzig, and J. Szpunar, Microelectron. Eng. 83, 221 (2006). https://doi.org/10.1016/j.mee.2005.08.008
- P. Sonnweber-Ribic, P. Gruber, G. Dehm, and E. Arzt, Acta Mater. 54, 3863 (2006). https://doi.org/10.1016/j.actamat.2006.03.057
- K. Mirpuri, H. Wendrock, S. Menzel, K. Wetzig, and J. Szpunar, Thin Solid Films 496, 703 (2006). https://doi.org/10.1016/j.tsf.2005.08.353
- S.-H. Lee and N.-J. Park, J. Kor. Inst. Met. & Mater. 45, 377 (2007).
- S.-H. Kim, J.-H. Kang, and S. Z. Han, Mater. Trans. 51, 659 (2010). https://doi.org/10.2320/matertrans.MG200910
- S. Zaefferer, P. Romano, and F. Friedel, J . Microscopy 230, 499 (2008). https://doi.org/10.1111/j.1365-2818.2008.02010.x
- EDAX-TSL, OIM Analysis 5.3 manual (2008).
- S. Suzuki, EBSD textbook: OIM analysis (B2.02).
- C.-H. Choi, H.-S. Nam, J.-H. Jeong, and D. N. Lee, J. Kor. Inst. Met. & Mater. 36, 1115 (1998).
- K. P. Mingard, B. Roebuck, E. G. Bennett, M. G. Gee, H. Nordenstrom, G. Sweetman, and P. Chan, Int. J. Ref. Metals & Hard Mater. 27, 213 (2009). https://doi.org/10.1016/j.ijrmhm.2008.06.009
- K. P. Mingard, B. Roebuck, E. G. Bennett, M. Thomas, B. P. Wynne, and E. J. Palmiere, J. Microscopy 227, 298 (2007). https://doi.org/10.1111/j.1365-2818.2007.01814.x
- Y. M. Park, D.-S. Ko, K.-W. Yi, I. Petrov, and Y.-W. Kim, Ultramicroscopy 107, 663 (2007). https://doi.org/10.1016/j.ultramic.2007.01.002
- J.-H. Kang and S.-H. Kim, Kor. J. Met. Mater. 48, 730 (2010).
- F. J. Humphreys, J. Mater. Sci. 36, 3833 (2001). https://doi.org/10.1023/A:1017973432592
- ASTM E112-96 (2003).
- E. E. Underwood, Quantitative Stereology, p.80-108, Addison-Wesley Pub. Co., Massachusetts (1970).
- Y. Takayama, N. Furushiro, T. Tozawa, H. Kato, and S. Hori, Mater. Trans. 32, 214 (1991). https://doi.org/10.2320/matertrans1989.32.214
- J.-H. Han and D.-H. Kim, Acta Metall. Mater. 43, 3185 (1995). https://doi.org/10.1016/0956-7151(95)00007-I