Nuclear Engineering and Technology

Korean Nuclear Society (한국원자력학회)
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NEW EVALUATION METHODS FOR RADIAL UNIFORMITY IN NEUTRON TRANSMUTATION DOPING

  • Kim, Hak-Sung (Department of Fundamental Energy Science, Graduate School of Energy Science Kyoto University) ;
  • Lim, Jae-Yong (Nuclear Engineering Science Division, Research Reactor Institute Kyoto University) ;
  • Pyeon, Cheol-Ho (Nuclear Engineering Science Division, Research Reactor Institute Kyoto University) ;
  • Misawa, Tsuyoshi (Nuclear Engineering Science Division, Research Reactor Institute Kyoto University) ;
  • Shiroya, Seiji (Nuclear Engineering Science Division, Research Reactor Institute Kyoto University) ;
  • Park, Sang-Jun (Basic Science and Technology Department, Korea Atomic Energy Research Institute) ;
  • Kim, Myong-Seop (Basic Science and Technology Department, Korea Atomic Energy Research Institute) ;
  • Oh, Soo-Youl (Basic Science and Technology Department, Korea Atomic Energy Research Institute) ;
  • Jun, Byung-Jin (Basic Science and Technology Department, Korea Atomic Energy Research Institute)
  • Received : 2009.12.07
  • Accepted : 2010.05.31
  • Published : 2010.08.31
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Abstract

Recently, the neutron irradiation for large diameter silicon (Si)-ingots of more than 8" diameter is requested to satisfy the demand for the neutron transmutation doping silicon (NTD-Si). By increasing the Si-ingot diameter, the radial non-uniformity becomes larger due to the neutron attenuation effect, which results in a limit of the feasible diameter of the Si-ingot. The current evaluation method has a certain limit to precisely evaluate the radial uniformity of Si-ingot because the current evaluation method does not consider the effect of the Si-ingot diameter on the radial uniformity. The objective of this study is to propose a new evaluation method of radial uniformity by improving the conventional evaluation approach. To precisely predict the radial uniformity of a Si-ingot with large diameter, numerical verification is conducted through comparison with the measured data and introducing the new evaluation method. A new concept of a gradient is introduced as an alternative approach of radial uniformity evaluation instead of the radial resistivity gradient (RRG) interpretation. Using the new concept of gradient, the normalized reaction rate gradient (NRG) and the surface normalized reaction rate gradient (SNRG) are described. By introducing NRG, the radial uniformity can be evaluated with one certain standard regardless of the ingot diameter and irradiation condition. Furthermore, by introducing SNRG, the uniformity on the Si-ingot surface, which is ignored by RRG and NRG, can be evaluated successfully. Finally, the radial uniformity flattening methods are installed by the stainless steel thermal neutron filter and additional Si-pipe to reduce SNRG.

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References

  1. R. D. Larrabee, “Neutron transmutation doping of semiconductor materials,” Proc. the Fourth Neutron Transmutation Doping Conf., Maryland, USA, Jun. 1-3, 1982.
  2. A. W. Cabonari, W. Pendl Jr., J. R. Sebastiao, et al., “An irradiation rig for neutron transmutation doping of silicon in the IEA-R1 research reactor,” Nucl. Inst. Methods B, 83, 157 (1993). https://doi.org/10.1016/0168-583X(93)95920-Z
  3. D. Alexiev, K. S. A. Butcher and T. L. Tansely, “Neutron transmutation doping of silicon for the production of radiation detectors,” Nucl. Inst. Methods B, 69, 510 (1992). https://doi.org/10.1016/0168-583X(92)95308-E
  4. P. E. Schmidt and J. Vedde, “High resistivity NTDproduction and applications,” Electrochemical Society Proceedings, 98, 3 (1998).
  5. M. S. Kim, A. Tarigan and A. Kornduangkaeo, “Guidelines on neutron transmutation doping and gem coloration,” IAEA Report of project C3-RAS/4/026, International Atomic Energy Agency (2008).
  6. B. J. Jun, C. S. Lee, B. C. Lee, et al., “Analysis of NTD method in HANARO,” Proc. Korean Nucl. Soc. Fall Mtg., Daejeon, Korea, Oct. 26-27, 2000.
  7. H. M. Janus and O. Malmros, “Application of thermal neutron irradiation for large scale production of homogeneous phosphorus doping of floatzone silicon,” IEEE Trans. Electron Devices, 23, 797 (1976). https://doi.org/10.1109/T-ED.1976.18487
  8. H. S. Kim, S. Y. Oh, B. J. Jun, et al., “Design of a neutron screen for 6” NTD irradiation in HANARO,” Nucl. Eng. Technol., 38, 675 (2006).
  9. M. S. Kim, C. S. Lee, S. Y. Oh, et al., “Radial uniformity of neutron irradiation in silicon ingot for neutron transmutation doping at HANARO,” Nucl. Eng. Technol., 38, 93 (2006).
  10. X-5 MONTE CARLO TEAM, “MCNP - A General Monte Carlo N-Particle Transport Code,” LA-CP-03-0245, Los Alamos National Laboratory (2003).
  11. P. F. Rose, “ENDF-201, ENDF/B-VI summary documentation,” BNL-NCS-17541, 4th Edition, Brookhaven National Laboratory (1991).
  12. R. E. MacFarlane and D. W. Muir, “The NJOY data processing system version 91,” LA-12740-M, Los Alamos National Laboratory (1994).
  13. Y. S. Cho, C. S. Gil and J. H. Chang, “The calculation of neutron scattering cross sections for silicon crystal at the thermal energies,” Nucl. Eng. Technol., 31, 631 (1999).
  14. A. K. Freund, “Cross-sections of materials used as neutron monochromators and filters,” Nucl. Inst. Methods., 213, 495 (1983). https://doi.org/10.1016/0167-5087(83)90447-7