References
- H.-S. Tae, J.-W. Han, S.-H. Jang, B.-N. Kim, B. J. Shin, B.-G. Cho, and S.-I. Chien, IEEE Trans. Plasma Sci. 32, 2189, (2004). https://doi.org/10.1109/TPS.2004.837612
- J.-W. Han, H.-S. Tae, B. J. Shin, S.-I. Chien, and D. H. Lee, IEEE Trans. Plasma Sci. 34, 324, (2006). https://doi.org/10.1109/TPS.2006.872444
- H.-S. Tae, C.-S. Park, B.-G Cho, J.-W. Han, B. J. Shin, S.-I. Chien, and D. H. Lee, IEEE Trans. Plasma Sci. 34, 996, (2006). https://doi.org/10.1109/TPS.2006.875828
- H.-J. Lee, D.-H. Kim, Y.-R. Kim, M.-S. Hahm, D.-K. Lee, J.-Y. Choi, C.-H. Park, J.-W. Rhyu, J.-K. Kim, and S.-G. Lee, SID Digest 35, 214, (2004). https://doi.org/10.1889/1.1821389
- J. H. Kim, C.-S. Park, B.-S. Kim, K.-H. Park, and H.-S. Tae, J. Inf. Disp. 8, 29, (2007). https://doi.org/10.1080/15980316.2007.9652036
- C.-S. Park and H.-S. Tae, Appl. Phys. lett. 96, 043504, (2010). https://doi.org/10.1063/1.3294629
- J. H. Kim, C.-S. Park, and H.-S. Tae, IDW Digest, 1945, (2008).
- T. Kosaka, K. Sakita, and K. Betsui, IDW/AD Digest, 1469, (2005).
- C.-S. Park, S. H. Kim, J.-H. Kim, and H.-S. Tae, J. Inf. Disp. 10, 195, (2009). https://doi.org/10.1080/15980316.2009.9652107
- C.-S. Park, B.-G. Cho, and H.-S. Tae, J. Inf. Disp. 9, 39, (2008). https://doi.org/10.1080/15980316.2008.9652069
- C.-S. Park and H.-S. Tae, IEICE Trans. Electronics E92-C, 161 (2009). https://doi.org/10.1587/transele.E92.C.161
- C.-S. Park, H.-S. Tae, Y.-K. Kwon, and E. G. Heo, Mol. Cryst. Liq. Cryst. 499, 224, (2008).
- N. Nikishin, A. Manakhov, Y.-K. Kim, M. Hur, and E. G. Heo, IMID Digest 8, 381, (2008).
- C.-S. Park, S.-K. Jang, H.-S. Tae, E.-Y. Jung, and J.-C. Ahn, J. Soc. Inf. Disp. 17, 977, (2009). https://doi.org/10.1889/JSID17.11.977
- C.-S. Park, H.-S. Tae, S.-I. Chien, and E.-Y. Jung, Eurodisplay Digest , 528, (2009).
- C.-S. Park, H.-S. Tae, Y.-K. Kwon, and E. G. Heo, IEEE Trans. Electron Devices 54, 1315, (2007). https://doi.org/10.1109/TED.2007.896578
- C.-S. Park and H.-S. Tae, Appl. Opt. 48, F76, (2009). https://doi.org/10.1364/AO.48.000F76
- C.-S. Park, H.-S. Tae, Y.-K. Kwon, and E. G. Heo, IEEE Trans. Plasma Sci. 35, 1511, (2007). https://doi.org/10.1109/TPS.2007.905208
- C.-S. Park, H.-S. Tae, Y.-K. Kwon, E. G. Heo, and B.-H. Lee, IEEE Trans. Electron Devices 55, 1345, (2008). https://doi.org/10.1109/TED.2008.921986
- C.-S. Park, H.-S. Tae, Y.-K. Kwon, and E. G. Heo, IEEE Trans. Plasma Sci. 36, 1925, (2008). https://doi.org/10.1109/TPS.2008.927134