Journal of Sensor Science and Technology (센서학회지)

The Korean Sensors Society (한국센서학회)
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Operation of a wide dynamic range CMOS image sensor based on dual sampling mechanism and its SPICE simulation

이중 샘플링 기반의 넓은 동작 범위 CMOS 이미지 센서의 동작 및 시뮬레이션을 통한 특성 분석

  • Kong, Jae-Sung (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Jo, Sung-Hyun (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Lee, Soo-Yeun (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Choi, Kyung-Hwa (Department of Sensor and Display Engineering, Kyungpook National University) ;
  • Seo, Sang-Ho (School of Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Shin, Jang-Kyoo (School of Electrical Engineering and Computer Science, Kyungpook National University)
  • 공재성 (경북대학교 전기전자컴퓨터학부) ;
  • 조성현 (경북대학교 전기전자컴퓨터학부) ;
  • 이수연 (경북대학교 전기전자컴퓨터학부) ;
  • 최경화 (경북대학교 센서 및 디스플레이공학과) ;
  • 서상호 (경북대학교 전기전자컴퓨터학부) ;
  • 신장규 (경북대학교 전기전자컴퓨터학부)
  • Received : 2010.01.08
  • Accepted : 2010.06.14
  • Published : 2010.07.31
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Abstract

In this paper, a dynamic range(DR) extension technique based on a 3-transistor active pixel sensor(APS) and dual image sampling is proposed. The feature of the proposed APS is that the APS uses two or more photodiodes with different sensitivities, such as a high-sensitivity photodiode and a low-sensitivity photodiode. Compared with previously proposed wide DR(WDR) APS, the proposed approach has several advantages, such as no-external equipments or signal processing, no-additional time-requirement for additional charge accumulation, simple operation and adjustable DR extension by controlling parasitic capacitance and sensitivity of two photodiodes. Approximately 16 dB of DR extension was evaluated from the simulation for the situation of 10 times of sensitivity difference and the same size of parasitic capacitance between those two photodiodes.

Keywords

References

  1. E. Fossum, “CMOS image sensor: Electronic camera-on-a-chip”, IEEE Trans. on Electron Devices, vol. 44, no. 10, pp. 1689-1698, 1997. https://doi.org/10.1109/16.628824
  2. M. Bigas, E. Cabruja, J. Forest, and J. Salvi, “Review of CMOS image sensors”, Microelectronics J., vol. 37, no. 5, pp. 433-451, 2006. https://doi.org/10.1016/j.mejo.2005.07.002
  3. A. Gamal, “Trends in CMOS image sensor technology and design”, IEDM Technical Digest, pp. 805-808, 2002.
  4. 서민웅, 서상호, 공재성, 신장규, “출력 전압 피드백을 통한 능동 화소 센서의 동작 범위 확장”, 센서학회지, 제18권, 제4호, pp. 274-279, 2009. https://doi.org/10.5369/JSST.2009.18.4.274
  5. 공재성, 서성호, 김상헌, 신장규, 이민호, “수광 회로와 윤곽 검출 회로의 분리를 통한 윤곽 검출용 시각칩의 해상도 향상”, 센서학회지, 제15권, 제2호, pp. 112-119, 2006. https://doi.org/10.5369/JSST.2006.15.2.112
  6. 김경도, 서상호, 서민웅, 신장규, “Charge pump 회로를 이용한 능동 픽셀 센서의 동작 범위 개선”, 센서학회지, 제17권, 제2호, pp. 114-119, 2008. https://doi.org/10.5369/JSST.2008.17.2.114
  7. G. G. Storm, J. E. D. Hurwitz, D. Renshaw, K. M. Findlater, R. K. Henderson, and M. D. Purcell, “Combined linear-logarithmic CMOS image sensor”, IEEE ISSCC Dig. Tech., pp. 112-113, San Francisco, USA, 2004.
  8. N. Akahane, N., Ryuzaki, R., Adachi, S., Mizobuchi, K., and Sugawa, S., “A 200 dB dynamic range iris-less CMOS image sensor with lateral overflow integration capacitor using hybrid voltage and current readout operation”, IEEE ISSCC Dig. Tech., pp. 1161-1170, San Francisco, USA, 2006.
  9. H.-Y. Hyun, J.-S. Kong, and J.-K Shin, “Low noise logarithmic active pixel sensor using a gate/n-well tied pMOSFET-type photodetector”, Sensors and Materials, vol. 20, no. 7, pp. 381-387, 2008.
  10. D. D. Yang, A. E. Gamal, B. Fowler, and H. Tian, “A 640×512 CMOS image sensor with ultra wide dynamic range floating-point pixel-level ADC”, IEEE ISSCC Dig. Tech., San Francisco, USA, pp. 308-309, 1999.
  11. S. Sugawa, N. Akanane, S. Adachi, K. Mori, T. Ishiuchi, and K. Mizobuchi, “A 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor”, IEEE ISSCC Dig. Tech., San Francisco, USA, pp. 352-603, 2005.
  12. M. Ikebe and K. Saito, “A wide-dynamic-range compression image sensor with negative-feedback resetting”, IEEE Sensors J., vol. 7, no. 5, pp. 897-904, 2007. https://doi.org/10.1109/JSEN.2007.894897
  13. M. Mase, S. Kawahito, M. Sasaki, and Y. Wakamori, “A 19.5 b dynamic range CMOS image sensor with 12 b column-parallel cyclic A/D converters”, IEEE ISSCC Dig. Tech., San Francisco, USA, pp. 350-603, 2005.

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