Measurement and Analysis of the Flux Profiles of the Coated Conductors using Magneto-optical Image and Scanning Hall Probe

Coated conductor에서 magneto-optical image와 scanning hall probe를 이용한 flux profile의 측정 및 분석

  • Received : 2010.03.09
  • Accepted : 2010.04.20
  • Published : 2010.04.30

Abstract

The magnetic flux profiles in SmBCO and YBCO coated conductors(CC) in the presence of the external field were comparatively investigated by magneto-optic image and scanning hall probe measurements. The current distributions calculated by using the inversion method from measured field profiles show that the decrease of current densities near the edges of SmBCO CC is more significant than those of YBCO CC. Through the comparison of the numerical analysis based on Kim's critical state model and the Brandt and Indenbom's solution, we found that this feature is related to their different field dependant properties of the critical current densities.

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References

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