전기학회논문지 (The Transactions of The Korean Institute of Electrical Engineers)

  • 제59권4호
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  • Pages.759-761
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  • 2010
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  • 1975-8359(pISSN)
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  • 2287-4364(eISSN)
대한전기학회 (The Korean Institute of Electrical Engineers)
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고주파 성분을 사용한 웨이블렛 기반 섬락 예측

Wavelet-Based Flashover Prediction Using High-Frequency Components

  • Song, Young-Chul (Kyungpook National University, School of Electrical Engineering and Computer Science)
  • 투고 : 2010.01.27
  • 심사 : 2010.03.03
  • 발행 : 2010.04.01
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초록

In order to monitor operating performance of contaminated outdoor insulators, a wavelet-based flashover prediction method is proposed. In most cases, the low-frequency components, namely, fundamental, $3^{rd}$, and $5^{th}$ harmonic components have been mainly used for the sake of the spectral analysis of the leakage current. However, in this paper, the detail coefficients of wavelet transform representing high-frequency components are used as important information to predict a flashover in the contaminated insulator. Experimental results verify that the proposed method has a superior capability for flashover prediction.

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참고문헌

  1. 김찬영, 김동명, 권태호, 이남우, "염분오손에 따른 배전설비의 누설전류 분석," 대한전기학회 2007년도 제38회 하계학술대회, 2007년, pp. 1476-1477.
  2. 김영석, 송길목, 김선구, "오염 환경하에서 고분자 절연 재료의 표면 누설전류 측정 및 열화 패턴 분석," 대한전기학회 2007년도 제38회 하계학술대회, 2007년, pp. 2080-2081.
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  5. A. H. El-Hag, S. H. Jayaram, and E. A. Cherney, "Fundamental and Low Frequency Harmonic Components of Leakage Current as a Diignosiic Tool to Study Aging of RTV and HTV Silicone Rubber in Salt-Fog," IEEE Trans. Dielectr. Electr. Insul. Vol. 10, No. 1, pp. 128-136, 2003. https://doi.org/10.1109/TDEI.2003.1176575
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  7. Y. C. Song and D. H. Choi, "High-frequency components of leakage current as diagnostic tool to study aging of polymer insulators under salt fog," Electronics Letters, Vol. 41, pp. 684-685, 2005. https://doi.org/10.1049/el:20050516
  8. S. Chandrasekar, C. Kalaivanan, A. Cavallini, and G. C. Montanari, "Investigations on Leakage Current and Phase Angle Characteristics of Porcelain and Polymeric Insulator under Contaminated Conditions," IEEE Trans. Dielectr. Electr. Insul. Vol. 16, pp. 574-583, 2009. https://doi.org/10.1109/TDEI.2009.4815193