과제정보
연구 과제 주관 기관 : 한국연구재단
참고문헌
- Y. H. Son, K. Y. Kim, C. I. Lim, B. K. Lee and E. G. Chang "Ferroelectric properties of Sm-doped PZT thin film," J. Korea Institute of Electrical and Electronic Materials Engineerings, Vol. 17, No.2, pp. 178-183 (2004) https://doi.org/10.4313/JKEM.2004.17.2.178
- H. S. Ju and Bernhard R. Tittmann, "Recent advances in scanning acoustic microscopy for adhesion evaluation of thin films," J. of Korean Society for Nondestructive Testing, Vol. 29, No.6, pp. 534-549 (2009)
- Z. Guo, J. D. Achenbach, A. Madan, K. Martin and M. E. Graham, "Modeling and acoustic microscopy measurements for evaluation of the adhesion between a film and a substrate," Thin Solid Films, Vol. 394, pp. 189-201 (2001)
- U. Rabe and W. Arnold, "Acoustic microscopy by atomic force microscopy," Appl. Phys. Lett., Vol. 64, pp. 1493-1495 (1994) https://doi.org/10.1063/1.111869
- K. Yamanaka and S. Nakano, "Quantitative elasticity evaluation by contact resonance in an atomic force microscope," Appl. Phys., Vol. 66, pp. S313 (1998) https://doi.org/10.1007/s003390051153
- K. Yamanaka and S. Nakano, "Ultrasonic atomic force microscope with overtone excitation of cantilever," Jpn, J. Appl. Phys., Vol. 35, pp. 3787-3792 (1996) https://doi.org/10.1143/JJAP.35.3787
- K. Yamanaka, H. Ogiso and O. Kolosov, "Ultrasonic force microscopy for nanometer resolution subsurface imaging," Appl. Phys. Lett., Vol. 64, No.2, pp. 178-180 (1994) https://doi.org/10.1063/1.111524
- M. J. Bamber, K. E. Cooke, A. B. Mann and B. Derby, "Accurate determination of Young's modulus and Poisson's ratio of thin film by a combination of acoustic microscopy and nanoindentation," Thin Solid Films, Vol. 398-399, pp. 299-305 (2001) https://doi.org/10.1016/S0040-6090(01)01341-4
- T. S. Park, D. R. Kwak, I. K. Park and C. S. Kim, "Vibro-contact analysis of ultrasonic atomic force microscopy tip and it's application to nano surface," J. of Korean Society for Nondestructive Testing, Vol. 30, No.2, pp. 132-138 (2010)
- C. Thomsen, H. T. Grahn, H. J. Maris and J. Tauc, "Surface generation and detection of phonons by picosecond light pulses," Phys. Rev. B, pp. 4129-4138 (1986)
- H. N. Lin, H. J. Maris and L. B. Freund, "Study of vibrational modes of gold nanostructures by picosecond ultrasonics," J. of Appl. Phys., Vol. 73, No.1, pp. 37-45 (1992)
- E. Chilla, T. Hesjedahl and H. J. Frohlich, "Nanoscale determination of phase velocity by scanning acoustic force microscopy," Phys. Rev. B., Vol. 55, pp. 15852-15855 (1997) https://doi.org/10.1103/PhysRevB.55.15852
- S. Parthasarathi, B. R. Tittmann, and R. J. Ianno, "Quantitative acoustic microscopy for characterization of the interface strength of diamond-like carbon thin film," Thin Solid Films, Vol. 300, pp. 42-50, (1997) https://doi.org/10.1016/S0040-6090(96)09501-6
- I. K. Park, C. K. Lee, D. S. Cho and Y. K. Kim, "Nondestructive evaluation of ceramic/ metal interface using the V(z) curve of scanning acoustic microscope," J. of Korean Welding and Joining Society, Vol. 23, No.2, pp. 59-65 (2005)
- R. D. Weglein, "Acoustic microscopy applied to SAW dispersion and film thickness measurement," IEEE. Trans. Sonics., Vol. SU-27. No.2, pp, 82-86 (1980)
- R. C. Bray, C. F. Quate, J. Calhoun, and R. Kock, "Film adhesion studies with the acoustic microscope," Thin Solid Films, Vol. 74, pp. 295-302 (1980) https://doi.org/10.1016/0040-6090(80)90093-0
- R. D. Weglein, "A model for predicting acoustic materials signatures," Appl. Phys. Lett .. Vol. 34, pp. 179-181 (1979) https://doi.org/10.1063/1.90741
- W. Parmon and, H. L. Bertoni, "Ray interpretation of the material signature in the acoustic microscope," Electron. Lett., Vol. 15, pp, 684-686 (1979) https://doi.org/10.1049/el:19790486
- T. Endo, Y. Sasaki, T. Yamagishi, and M. Sakai, "Determination of sound velocities by high frequency complex V(z) measurement in acoustic microscopy," Jpn. Appl. Phys., Vol. 31, pp. 160-162 (1992) https://doi.org/10.1143/JJAP.31.L160
- C. Miyasaka and B. R. Tittmann, "Characterization of stress at a ceramic/metal joined interface by the V(z) technique of scanning acoustic microscopy," J. Pressure Vessel Technol. Vol. 124, No.3, pp. 336-342