DOI QR코드

DOI QR Code

Emission Characteristics of White OLEDs with Various Hole Transport Layers

정공수송층에 따른 백색 OLED의 발광 특성

  • Lim, Byung-Gwan (Department of Electronic Engineering, Daejin University) ;
  • Seo, Jung-Hyun (Department of Electronic Engineering, Daejin University) ;
  • Ju, Sung-Hoo (Department of Advanced Materials Science & Engineering, Daejin University) ;
  • Paek, Kyeong-Kap (Department of Electronic Engineering, Daejin University)
  • Received : 2010.08.24
  • Accepted : 2010.11.05
  • Published : 2010.12.01

Abstract

In order to investigate the emission characteristics of the phosphorescent white organic light-emitting diodes (PHWOLEDs) according to various hole transport layers (HTLs), PHWOLEDs composed of HTLs whose structure are NPB/TCTA, NPB/mCP and NPB/TCTA/mCP, two emissive layers (EMLs) which emit two-wavelengths of light (blue and red), and electron transport layer were fabricated. The applied voltage, power efficiency, and external quantum efficiency at a current density of $1 mA/cm^2$ for the fabricated PHWOLEDs were 7.5 V, 11.5 lm/W, and 15%, in case of NPB/mCP, 5 V, 14.8 lm/W, and 13.7%, in case of NPB/TCTA, and 5.5 V, 14.6 lm/W, and 15%, in case of NPB/TCTA/mCP in the hole transport layer, respectively. High emission efficiency can be obtained when the amount of hole injection from anode is balanced out by the amount of electron injection from the cathode to EML by using NPB/TCTA/mCP structured HTL.

Keywords

References

  1. C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987). https://doi.org/10.1063/1.98799
  2. J. Kido, M. Kimura, and K. Nagai, Science 267, 1332 (1995). https://doi.org/10.1126/science.267.5202.1332
  3. T. Tsuboi, H. Murayama, S.-J. Yeh, and C.-T. Chen, Opt. Mater. 29, 1299 (2007). https://doi.org/10.1016/j.optmat.2006.06.005
  4. V. Sivasubramaniam, F. Brodkorb, S. Hanning, H. P. Loebl, V. van Elsbergen, H. Boerner, U. Scherf, and M. Kreyenschmidt, J. Fluor. Chem. 130, 640 (2009). https://doi.org/10.1016/j.jfluchem.2009.04.009
  5. J. H. Seo, Y. K. Kim, and Y. Ha, Thin Solid Films 517, 1807 (2009). https://doi.org/10.1016/j.tsf.2008.09.075
  6. S. Tokito, T. Tsuzuki, F. Sato, and T. Iijima, Curr. Appl. Phys. 5, 331 (2005). https://doi.org/10.1016/j.cap.2003.11.094
  7. H. I. Baek and C. H. Lee, J. Phys. D: Appl. Phys. 41, 105101 (2008). https://doi.org/10.1088/0022-3727/41/10/105101
  8. G. Lei, L. Wang, and Y. Qiu, Appl. Phys. Lett. 88, 103508 (2006). https://doi.org/10.1063/1.2185255
  9. K. S. Yook, S. O. Jeon, C. W. Joo, and J. Y. Lee, Org. Electron. 10, 170 (2009). https://doi.org/10.1016/j.orgel.2008.10.018
  10. J. Lee, J.-I. Lee, and H. Y. Chu, Synth. Met. 159, 991 (2009). https://doi.org/10.1016/j.synthmet.2008.12.031
  11. Y. Sun and S. R. Forrest, Appl. Phys. Lett. 91, 263503 (2007). https://doi.org/10.1063/1.2827178
  12. K. S. Yook, S. O. Jeon, C. W. Joo, and J. Y. Lee, Appl. Phys. Lett. 93, 113301 (2008). https://doi.org/10.1063/1.2982917
  13. J. Lee, J.-I. Lee, K.-I. Song, S. J. Lee, and H. Y. Chu, Appl. Phys. Lett. 92, 203305 (2008). https://doi.org/10.1063/1.2936837