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Light Extraction Improvement of 400 nm Wavelength GaN-Based Light-Emitting Diode by Textured Structures

거친 표면구조를 이용한 400 nm 파장 GaN계 발광다이오드의 광 추출효율 개선

  • Published : 2009.07.31

Abstract

We fabricated the GaNLED emitting 400 nm wavelength and improved the optical extraction efficiency by making surface patterns on n-GaN layer and ITO layer above p-GaN. In addition, the light reflection metal under the n and p pad is made and the light reflection metal is installed on the backside of the chip. The light extraction efficiency is increased by 20 % with texturing n-GaN layer and 18% with texturing ITO layer at 20 mA. Compared to planar-surface LED, the light extraction efficiency for surface texturing both n-GaN and ITO is increased by 32% at 20mA.

400nm 파장을 방출하는 GaN LED를 제조하여, n-GaN층과 p-GaN층의 위에 있는 ITO층 표면에 패턴을 만들어 광 추출 효율을 향상시켰다. 추가적으로, n과 p패드 아래와 칩의 바닥면에 각각 광반사 금속을 설치하였다. 광 추출 효율은 20mA에서 n-GaN의 텍스쳐링에 의해 20% 증가되었고 ITO의 텍스쳐링에 의해 18% 증가되었다. 표면 처리가 않된 LED와 비교해서 n-GaN와 ITO를 함께 표면 텍스쳐링 했을때의 광 추출 효율은 20mA에서 32% 증가되었다.

Keywords

References

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