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Effects of Aging Process in Kinetic Movement of Charged Paticles

에이징 공정이 대전입자 운동에 미치는 영향

  • Kim, In-Ho (Dept of Computer and Electronics Engineering, ChungWoon University) ;
  • Kim, Young-Cho (Dept of Computer and Electronics Engineering, ChungWoon University)
  • 김인호 (청운대학교 전산전자공학과) ;
  • 김영조 (청운대학교 전산전자공학과)
  • Published : 2009.06.30

Abstract

We analyze voltage characteristics of charged particle type display according to particle layers and cell gap between two electrodes and ascertain the aging effects by measuring the response time of particles with and without aging process. The threshold/driving/breakdown voltage is proportional to layers of charged particles and cell gap and the response time at driving voltage is faster than that of threshold and breakdown voltage because of different q/m of color and black particles. The analysis of response time is a method of estimation of optical characteristics, driving voltage and particle lumping and these results are promoted by aging process. We use the laser and photodiode to measure response time and optical properties. It has not been studied and reported to analyze the relationship of response time, threshold/driving/breakdown voltage, lumping phenomena, cell gap, and aging process for charged particle type display.

본 논문은 대전입자형 디스플레이의 입자층과 상판과 하판의 전극간격(cell gap)으로 전압특성을 분석하여 에이징 전압 인가 전, 후의 응답속도를 측정하였다. 입자층이 증가할수록 비례하여 문턱/구동/항복 전압이 증가하였고 응답속도는 켈러입자와 검정입자의 q/m값의 차이로 문턱/항복 전압보다 구동전압에서의 응답속도가 빠른 것을 확인하였다. 응답속도는 레이저와 포토다이오드를 이용하여 광학특성으로 측정하였고 입자의 뭉침현상은 aging공정으로 최소화 하였다. 아직까지 대전입자형 디스플레이의 응답속도와 문턱/구동/항복 전압 및 입자주입층, cell gap, aging공정에 관하여 보고된 바 없으며 이에 상관관계를 평가하고 영향을 분석하였다.

Keywords

References

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Cited by

  1. Effect of Electrode Space on Optical Property in Three-Electrode Type E-paper Display vol.29, pp.4, 2016, https://doi.org/10.4313/JKEM.2016.29.4.231