Carbon letters

Korean Carbon Society (한국탄소학회)
권호 표지
DOI QR코드

DOI QR Code

Improvement of the Field Emission Stability of Carbon Nanotube Paste Emitter by Post-treatments

  • Received : 2009.07.14
  • Accepted : 2009.09.11
  • Published : 2009.09.30
Download PDF
⟨ Previous Next ⟩

Abstract

The field emitters were fabricated by screen-printing of carbon nanotube paste, and their emission stabilities were evaluated. It was found that the emission stability measured in a sealed device is much higher than that measured in a vacuum chamber in spite of similar pressure. This was because oxygen gas was scarcely remained in the sealed device, while the gas is continuously supplied into the vacuum chamber during the stability measurement. It was found that the plasma treatment etched the protruded CNTs, resulting in the uniform height of CNT tips. As a result, the stability was increased remarkably. It was also found that the stability of CNT paste emitter was improved by electrical aging and that the optimum condition for the aging was varied with the size of emitter.

Keywords

References

  1. Rao, A. M.; Jacques, D.; Haddon, R. C.; Zhu, W.; Bower, C.; Jin, S. Appl. Phys. Lett. 2000, 76, 3813. https://doi.org/10.1063/1.126790
  2. Cha, O. H.; Jeong, M. S.; Byeon, C. C.; Jeong, H.; Han, J. H.; Choi, Y. C.; An, K. H.; Oh, K.; Kim, K. K.; Lee, Y. H. Carbon Lett. 2009, 10, 9. https://doi.org/10.5714/CL.2009.10.1.009
  3. Kwon, S. J. Jpn. J. Appl. Phys. 2007, 46, 5988. https://doi.org/10.1143/JJAP.46.5988
  4. Kim, Y. C.; Yoo, E. H. Jpn. J. Appl. Phys. 2005, 44, L454. https://doi.org/10.1143/JJAP.44.L454
  5. Nam, J. W.; Cho, S. H.; Choi, Y. C.; Ha, J. S.; Park, J. H.; Choe, D. H.; Yoo, J. B.; Park, J. H. Diamond Relat. Mater. 2005, 14, 2089. https://doi.org/10.1016/j.diamond.2005.08.049
  6. Choi, Y. C.; Jeong, K. S.; Han, I. T.; Kim, H. J.; Jin, Y. W.; Kim, J. M.; Lee, B. G.; Park, J. H.; Choe, D. H. Appl. Phys. Lett. 2006, 88, 263504. https://doi.org/10.1063/1.2217711
  7. Seelaboyina, R.; Huang, J.; Choi, W. B. Appl. Phys. Lett. 2006, 88, 194104. https://doi.org/10.1063/1.2203218
  8. Park, J. H.; Moon, J. S.; Nam, J. W.; Yoo, J. B.; Park, C. Y.; Kim, J. M.; Park, J. H.; Lee, C. G.; Choe, D. H. Diamond Ralat. Mater. 2005, 14, 2113. https://doi.org/10.1016/j.diamond.2005.08.063
  9. Qin, Y.; Hu, M. Appl. Surf. Sci. 2008, 254, 1757. https://doi.org/10.1016/j.apsusc.2007.07.174
  10. Kim, W. S.; Lee, J.; Jeong, T. W.; Heo, J. N.; Kong, B. Y.; Jin, Y. W.; Kim, J. M.; Cho, S. H.; Park, J. H.; Choe, D. H. Appl. Phys. Lett. 2005, 87, 163112. https://doi.org/10.1063/1.2099538
  11. Liang, X. H.; Deng, S. Z.; Xu, N. S.; Chen, J.; Huang, N. Y.; She, J. C. Appl. Phys. Lett. 2006, 88, 111501. https://doi.org/10.1063/1.2180439
  12. Zhu, X. Y.; Lee, S. M.; Lee, Y. H.; Frauenheim, T. Phys. Rev. Lett. 2000, 85, 2757. https://doi.org/10.1103/PhysRevLett.85.2757
  13. Purcell, S. T.; Vincent, P.; Journet C.; Binh, V. T. Phys. Rev. Lett. 2002, 88, 105502. https://doi.org/10.1103/PhysRevLett.88.105502
  14. Choi, G. S.; Son, K. H.; Kim, D. J. Microelectronic Engineering 2003, 66, 206. https://doi.org/10.1016/S0167-9317(03)00048-0
  15. Jankowski, A.; Hayes, J.; Morse, J.; Ferreira, J. Thin Solid Films 1999, 355, 194. https://doi.org/10.1016/S0040-6090(99)00515-5
  16. Choi, Y. C.; Shin, Y. M.; Lee, Y. H.; Lee, B. S.; Park, G. S.; Choi, W. B.; Lee, N. S.; Kim, J. M. Appl. Phys. Lett. 2000, 76, 2367. https://doi.org/10.1063/1.126348
  17. Lee, N. S.; Chung, D. S.; Han, I. T.; Kang, J. H.; Choi, Y. S.; Kim, H. Y.; Park, S. H.; Jin, Y. W.; Yi, W. K.; Yun, M. J.; Jung, J. E.; Lee, C. J.; You, J. H.; Jo, S. H.; Lee, C. G.; Kim, J. M. Diamond Relat. Mater. 2001, 10, 265. https://doi.org/10.1016/S0925-9635(00)00478-7
  18. Jeong, H. J.; Lim, S. C.; Kim, K. S.; Lee, Y. H. Carbon 2004, 42, 3065.