Characteristic Analysis of Band Width Based on Rugate Porous Silicon Containing Photonic Nanocrystal

광 결정의 나노 구조를 갖는 Rugate 다공성 실리콘의 반치폭 값에 대한 특성 분석

  • Received : 2009.02.26
  • Accepted : 2009.03.04
  • Published : 2009.03.31

Abstract

Photonic crystals containing multiple rugate structure are prepared by electrochemical etchings. Typically etched rugate PSi prepared in this study. Etching is carried out in a Teflon cell by using a two-electrode configuration with a Pt mesh counter electrode. They exhibit sharp photonic band gaps in the optical reflectivity spectrum. This reflectivity can be tuned to appear anywhere in the visible to near-infrared spectral range, depending on the programmed etch waveform. We study the method of full width half maxima and reflectivity index control by using amplitude.

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