References
- A. Kerber, E. Cartier, L. Pantisano, R. Degraewve, T. Kauerauf, Y. Kim, A. Hou, G. Groeseneken, H. E. Maes, and U. Schwalke, IEEE Electron Device Lett. 24, 87 (2003) https://doi.org/10.1109/LED.2003.808844
- G. D. Wilk and D. A. Muller, Appl. Phys. Lett. 83, 3984 (2003) https://doi.org/10.1063/1.1626019
- S. Zafer, A. Kumer, E. Gusev, and E. Cartier, IEEE Trans. Device Mater. Reliab. 5, 45 (2005) https://doi.org/10.1109/TDMR.2005.845880
- D. Lim and R. Haight, J. Vac. Sci. Technol. B 23, 201 (2005) https://doi.org/10.1116/1.1850105
- H. Jin, H.J. Kang, and M.-H. Cho, 한국진공학회:학술대회논문집 31, 138 (2006)
- 김석환, 백재윤, 김민국, 박호영, 안종렬, 박종윤, 김윤수, 황한나, 황찬국, 안기석, 한국진공학회:학술대회논문집 30, 65 (2006)
- R. Rub and P. W. R. Corfield, L. Am. Ceram. Soc. 53, 126 (1970) https://doi.org/10.1111/j.1151-2916.1970.tb12052.x
- R. M. Wallace and G. D. Wilk, Crit. Rev. Solid State Mater. Sci. 28, 231 (2003) https://doi.org/10.1080/714037708
- J. Roberston, Rep. Prog. Phys. 69, 327 (2006) https://doi.org/10.1088/0034-4885/69/2/R02
- N. Miyata, Appl. Phys. Lett. 89, 102903 (2006) https://doi.org/10.1063/1.2337878
- D. Y. Cho, K. S. Park, B. H. Choi, S. J. Oh, Y. J. Chang, D. H. Kim, T. W. Noh, R. Jung, J. C. Lee, and S. D. Bu, Appl. Phys. Lett. 88, 193502 (2006) https://doi.org/10.1063/1.2201050
- X. Y. Qiu, H. W. Liu, F. Fang, M. J. Ha, and J. M. Liu, Appl. Phys. Lett. 88, 072906 (2006) https://doi.org/10.1063/1.2168505
- H. S. Baik, M. Kim, G.-S. Park, S. A. Song, M. Varela, A. Franceschetti, S. T. Pantelides, and S. J. Pennycook, Appl. Phys. Lett. 85, 672 (2004) https://doi.org/10.1063/1.1772855
- Y. Y. Lebedinskii, A. Zenkevich, E. P. Gusev, and M. Gribelyuk, Appl. Phys. Lett. 86, 191904 (2005) https://doi.org/10.1063/1.1923158
- C. M. Perkins, B. B. Triplett, P. C. McIntyre, K. C. Saraswat, and E. Shero, Appl. Phys. Lett. 81, 1417 (2002) https://doi.org/10.1063/1.1499513
- S. Ferrari and G. Scarel, J. Appl. Phys. 96, 144 (2004) https://doi.org/10.1063/1.1753080
- E. Ryshkewitch and D. W. Richerson, Oxide Ceramics: Physical Chemistry and Technology, (Academic Press, 1985), 471
- J. Wang, H. P. Li, and R. Stevens, J. Mater. Sci. 27, 5397 (1992) https://doi.org/10.1007/BF00541601
- V. B. Glushkova and M. V. Kravchinskaya, Ceram. lnt. 11, 56 (1985) https://doi.org/10.1016/0272-8842(85)90010-0
- C. Tang, B. Tuttle, and R. Ramprasad, Phys. Rev. B 76, 073306 (2007) https://doi.org/10.1103/PhysRevB.76.073306
- G. Kresse and J. Hafner, Phys. Rev. B 47, 558 (1993); G. Kresse and J. Hafuer, Phys. Rev. B 49, 14251 (1994) https://doi.org/10.1103/PhysRevB.47.558
- G. Kresse and J. Hafuer, Phys. Rev. B 49, 14251 (1994) https://doi.org/10.1103/PhysRevB.49.14251
- G. Kresse and J. Furthiiller, Comput. Mat. Sci. 6, 15 (1996) https://doi.org/10.1016/0927-0256(96)00008-0
- G. Kresse and J. Furthuller, Phys. Rev. B 54, 11169 (1996) https://doi.org/10.1103/PhysRevB.54.11169
- G. Kresse and D. Joubert, Phys. Rev. B 59, 1758 (1999) https://doi.org/10.1103/PhysRevB.59.1758
- D. Vanderbilt, Phys. Rev. B 41, R7892 (1990) https://doi.org/10.1103/PhysRevB.41.7892
- D. M. Wood and A. Zunger, J. Phys. A 18, 1343 (1985) https://doi.org/10.1088/0305-4470/18/9/018
- P. Pulay, Chern. Phys. Lett. 73, 393 (1980) https://doi.org/10.1016/0009-2614(80)80396-4
- E. Wiberg and A. F. Holleman, Inorganic Chemistry, (Elsevier, 2001), 857
- K. Momma and F. Izumi, J. Appl. Crystallogr. 41, 653 (2008) https://doi.org/10.1107/S0021889808012016