Journal of the Korean Society of Manufacturing Process Engineers (한국기계가공학회지)

The Korean Society of Manufacturing Process Engineers (한국기계가공학회)
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Defect Inspection of the Pixels in OLED Type Display Device by Image Processing

화상처리를 이용한 OLED 디스플레이의 픽셀 불량 검사에 관한 연구

  • 박경석 (금오공과대학교 기계공학부) ;
  • 신동원 (금오공과대학교 기계공학부)
  • Received : 2009.03.17
  • Accepted : 2009.06.24
  • Published : 2009.06.30
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Abstract

The image processing methods are widely used in many industrial fields to detect defections in inspection devices. In this study an image processing method was conducted for the detection of abnormal pixels in a OLED(Organic Light Emitting Diode) type panel which is used for small size displays. The display quality of an OLED device is dependent on the pixel formation quality. So, among the so many pixels, to find out the faulty pixels is very important task in manufacturing processing or inspection division. We used a line scanning type BW(Black & White) camera which has very high resolution characteristics to acquire an image of display pixel patterns. And the various faulty cases in pixel abnormal patterns are considered to detect abnormal pixels. From the results of the research, the normal BW pixel image could be restored to its original color pixel.

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References

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