References
- J.-M. Lehn, Science 295, 2400 (2002) https://doi.org/10.1126/science.1071063
- X. L. Guo, Z. C. Dong, A. S. Trifonov, K. Miki, K. Kimura, and S. Mashiko, Appl. Phys. A 81, 367 (2005) https://doi.org/10.1007/s00339-004-2896-3
- S. K. Dey, T. S. M. Abedin, L. N. Dawe, S. S. Tandon, J. L. Collins, L. K. Thompson, A. V. Postnikov, M. S. Alam, and P. Muller, Inorg. Chem. 46, 7767 (2007) https://doi.org/10.1021/ic070336a
- M. Ruben, J.-M. Lehn, and P. Muller, Chem. Soc. Rev. 35, 1056 (2006) https://doi.org/10.1039/b517267p
- J. Yin, Q. Guo, and R. E. Palmer, J. Phys. Chem. B 107, 209 (2003) https://doi.org/10.1021/jp026490u
- P. J. Thomas, N. Berovic, P. Laitenberger, R. E. Palmer, N. Bampos, and L. K. M. Sanders, Chem. Phys. Lett. 294, 229 (1998) https://doi.org/10.1016/S0009-2614(98)00790-8
- B. Hulsken, R. van Hameren, P. Thordarson, J. W. Gerritsen, R. J. M. Nolte, A. E. Rowan, M. J. Crossley, J. A. A. W. Elemans, and S. Speller, Jpn. J. Appl. Phys. 45, 1953 (2006) https://doi.org/10.1143/JJAP.45.1953
- T. Ikeda, M. Asakawa, M. Goto, K. Miyake, T. Ishida, and T. Shimizu, Langmuir 20, 5454 (2004) https://doi.org/10.1021/la049577a
- X. Qiu, C. Wang, Q. Zeng, B. Xu, S. Yin, H. Wang, S. Xu, and C. Bai, J. Am. Chem. Soc. 122, 5550 (2000) https://doi.org/10.1021/ja994271p
- S. B. Lei, J. Wang, Y. H. Dong, C. Wang, L. J. Wan, and C. L. Bai, Surf. Interface Anal. 34, 767 (2002) https://doi.org/10.1002/sia.1407
- Y. Zhou,B. Wang, M. Zhu, and J. G. Hou, Chem. Phys. Lett. 403, 140(2005) https://doi.org/10.1016/j.cplett.2005.01.006
- N. Aratani, A. Osuka, Y. H. Kim, D. H. Jeong, and D. Kim, Angew. Chem. Int. Ed. 39, 1458 (2000) https://doi.org/10.1002/(SICI)1521-3773(20000417)39:8<1458::AID-ANIE1458>3.0.CO;2-E
- R. A. Haycock, C. A. Hunter, D. A. James, U. Michelsem, and L. R. Sutton, Org. Lett. 2, 4235 (2000)
- T. N. Milic, N. Chi, D. G. Yablon, G. W. Flynn, J. D. Batteas. And C. M. Drain, Angew. Chem. Int. Ed. 41, 2117 (2002) https://doi.org/10.1002/1521-3773(20020617)41:12<2117::AID-ANIE2117>3.0.CO;2-2
- T. Malinski, and Z. Taha, Nature 358, 676 (1992) https://doi.org/10.1038/358676a0
- Y. Harima, H. Okazaki, Y. Kunugi, K. Yamashita, H. Ishii, and K. Seki, Appl. Phys. Lett. 69, 1059 (1996) https://doi.org/10.1063/1.116930
- J. R. Reimers, T. X. Lu, M. J. Crossley, and N. S. Hush, Nanotechnology 7, 424 (1996) https://doi.org/10.1088/0957-4484/7/4/022
- C. H. M. Maree, S. J. Roosendaal, T. J. Savenije, R. E. I. Schropp, T. J. Schaafsma, and F. H. P. M. Habraken, J. Appl. Phys. 80, 3381 (1996) https://doi.org/10.1063/1.363203
- J. Kido, M, Kimura, and K. Nagai, Science 267, 1332 (1995) https://doi.org/10.1126/science.267.5202.1332
- Z. Bao, Z. A. Dodabalapur, and A. J. Lovinger, Appl. Phys. Lett. 69, 4108 (1996) https://doi.org/10.1063/1.117834
- J. A. A. W. Elemans, M. C.Lensen, J. W. Gerrisen, H. Van Kempen, S. Speller, R. J. M. Nolte, and A. E. Rowan, Adv. Mater. 15, 2070 (2003) https://doi.org/10.1002/adma.200305602
- Unpublished results
- 손승배, 이해성, 전일철, 한재량, 한국진공학회지 15, 81 (2006)
- S. B. Son, H. Lee, I. C. Jeon, S. K. Park, and J. R. Hahn, J. Nanosci. Nanotech. 6, 2494 (2006)
- P. Samori, H. Engelkamp, P. de Witte, A. E. Rowan, R. J. M. Nolte, and J. P. Rabe, Angew. Chem. Int. Ed. 40, 2348 (2001) https://doi.org/10.1002/1521-3773(20010618)40:12<2348::AID-ANIE2348>3.0.CO;2-I