Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Study on he Optical and Electrical Properties of $In_2O_3-ZnO$ Thin Films Fabricated by Pulsed Laser Deposition

PLD 법으로 제작한 $In_2O_3-ZnO$ 박막의 광학적 및 전기적 특성

  • Shin, Hyun-Ho (Dept. of Electronics Engineering, Inha University) ;
  • Han, Jung-Woo (Dept. of Electronics Engineering, Inha University) ;
  • Kang, Seong-Jun (Dept. of Electrical and Semiconductor Engineering, Chonnam National University) ;
  • Yoon, Yung-Sup (Dept. of Electronics Engineering, Inha University)
  • 신현호 (인하대학교 전자공학과) ;
  • 한정우 (인하대학교 전자공학과) ;
  • 강성준 (전남대학교 전기 및 반도체공학과) ;
  • 윤영섭 (인하대학교 전자공학과)
  • Published : 2008.07.25
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Abstract

In this study, $In_2O_3-ZnO$ thin films are prepared on quartz substrates by the pulsed laser deposition and their optical and electrical properties are investigated as the function of substrate temperatures ($200{\sim}600^{\circ}C$) at the fixed oxygen pressure of 200 mTorr. The XRD measurement shows that polycrystalline $In_2O_3-ZnO$ thin films are formed. In the XRD measurement, the intensity of the (400) $In_2O_3$ peak at $35.5^{\circ}$ decreases and that of the (222) $In_2O_3$ peak at $30.6^{\circ}$ increases with the increase substrate temperature up to $500^{\circ}C$. From the result of AFM measurement, the morphology of $In_2O_3-ZnO$ thin films are observed as round-type grains. The lowest surface roughness (6.15 nm) is obtained for the $In_2O_3-ZnO$ thin film fabricated at $500^{\circ}C$. The optical transmittance of $In_2O_3-ZnO$ thin films are higher than 82% in the visible region. The maximum carrier concentration of $2.46{\times}10^{20}cm^{-3}$ and the minimum resistivity of $1.36{\times}10^{-3}{\Omega}cm$ are obtained also for the $In_2O_3-ZnO$ thin film fabricated at $500^{\circ}C$.

본 연구에서는 펄스 레이저 법으로 200 mTorr 의 산소 분압에서 기판 온도를 $200^{\circ}C$ 에서 $600^{\circ}C$ 까지 변화시켜 가며, quartz 기판 위에 $In_2O_3-ZnO$ 박막을 제작하여 광학적 및 전기적 특성을 조사하였다. XRD 측정을 통해 $In_2O_3-ZnO$ 박막이 다결정 상태인 것을 알 수 있었으며, 기판 온도가 $500^{\circ}C$로 증가함에 따라 $35.5^{\circ}$ 부근의 $In_2O_3$ (400) 피크는 감소한 반면 $30.6^{\circ}$ 부근의 $In_2O_3$ (222) 피크는 증가했다. 박막의 표면을 AFM 으로 조사한 결과, round type 의 결정립들이 관찰되었으며 표면 거칠기 값은 $500^{\circ}C$에서 제작한 박막에서 가장 낮은 값 (6.15 nm) 을 나타내었다. 모든 $In_2O_3-ZnO$ 박막이 가시광 영역에서 평균 82% 이상의 투과율을 보였다. 또, $500^{\circ}C$에서 제작한 $In_2O_3-ZnO$ 박막에서 가장 높은 캐리어 농도 ($2.46{\times}10^{20}cm^{-3}$) 값과 가장 낮은 비저항 ($1.36{\times}10^{-3}{\Omega}cm$) 값을 나타내었다.

Keywords

References

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