Journal of the Korean Institute of Illuminating and Electrical Installation Engineers (조명전기설비학회논문지)

The Korean Institute of IIIuminating and Electrical Installation Engineers (한국조명전기설비학회)
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An Improved Model for Grounding System Using Examination of Dangerous Voltage

위험전압 검토에 따른 개선된 접지설비 모델

  • Published : 2008.04.30
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Abstract

When we design the grounding grid, dangerous voltage IEEE Std. 80 method has been commonly used in the domestic area. However there is not appropriative examination of ground design environment. So in this paper, we examined of IEEE Std. 80 touch voltage method's marginal utility and we induced corrective factor for those problems by comparison between IEEE Std. 80 touch voltage value and simulation experimentation value. Moreover, Logistic model's corrective factor we proved the maximum accidental error has reduced less than 10[%].

국내 접지설계시 가장 널리 사용되는 것은 IEEE Std. 80 위험전압 계산식이나 국내 접지설계 환경의 적정성 여부는 검토되지 않고 있다. 따라서, 본 논문에서는 IEEE Std. 80 접촉전압 계산식의 적용한계를 검토하고 그 문제점을 극복하기 위해 IEEE Std. 80 접촉전압값과 컴퓨터 모의실험값을 비교하여 접촉전압 계산식의 보정계수 $K_a$를 유도하였다. 또한, 유도된 모델 중 Logistic 모델 형식의 보정계수를 적용할 경우 최대 오차율이 10[%]미만인 것을 검증함으로써 고가의 프로그램을 사용하지 않고도 안전하고 경제적인 접지설계를 할 수 있는 방법을 제시하였다.

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References

  1. ANSI/IEEE Std. 80-1986, "IEEE Guide for Safety in AC Substation Grounding", Institute of Electrical and Electronics Engineers, Inc., New York, 1986
  2. ANSI/IEEE Std. 80-2000, "IEEE Guide for Safety in AC Substation Grounding", Institute of Electrical and Electronics Engineers, Inc., New York, 2000
  3. J. G. Sverak, "Progress in Step and Touch Voltage Equations of ANSI/IEEE Std. 80 - Historical Perspective", IEEE Transactions on Power Delivery, Vol. 13, No. 3, 1998
  4. B. Thapar, "Simplified Equations for Mesh and Step Voltages in an AC Substation", IEEE Transcations on Power Delivery, Vol. 6, No. 2, 1991
  5. 문태완외, "IEEE Std-2000의 메쉬전압식 적용한계의 검토", 대한전기학회 추계학술대회 논문집, 2001
  6. "Current Distrigution, Electromagnetic Interference, Grounding Ad Soil Structure Analysis", SES, 1997

Cited by

  1. Mesh Grounding Design Based on the Study of Dangerous Voltage on Limited Sites vol.25, pp.11, 2011, https://doi.org/10.5207/JIEIE.2011.25.11.091