References
- N. Suzuki and N. Iizuka, Jpn. J. Appl. Phys. 36, L1006 (1997) https://doi.org/10.1143/JJAP.36.1006
- C. Gmachl, H. M. Ng, and A. Y. Cho, Appl. Phys. Lett. 77, 334 (2000) https://doi.org/10.1063/1.126968
- K. Kishino, A. Kikuchi, H. Kanazawa, and T. Tachibana, Appl. Phys. Lett. 81, 1234 (2002) https://doi.org/10.1063/1.1500432
- M. Rochat, L. Ajili, H. Willenberg, J. Faist, H. Beere, G. Davies, E. Linfield, and D. Ritchie, Appl. Phys. Lett. 81, 1381 (2002) https://doi.org/10.1063/1.1498861
- G. Scalari, L. Ajili, J. Faist, H. Beere, E. Linfield, D. Ritchie, G. Davies, Appl. Phys. Lett. 82, 3165 (2003) https://doi.org/10.1063/1.1571653
- B. S. Williams, S. Kumar, Q. Hu and J. L. Ren, Electron. Lett. 40, 431 (2004) https://doi.org/10.1049/el:20040300
- A. A. Kosterev, R. F. Curl, F. K. Tittel, C. Gmachl, F. Capasso, D. L. Sivco, J. N. Baillargeon, A. L. Hutchinson, and A. Y. Cho, Appl. Opt. 39, 4425 (2000) https://doi.org/10.1364/AO.39.004425
- A. A. Kosterev and F. K. Tittel, IEEE J. Quantum. Electron. 38, 582 (2002) https://doi.org/10.1109/JQE.2002.1005408
- J. Faist, F. Capasso, D. L. Sivco, C. Sirtori, A. L. Hutchinson, and A. Y. Cho, Science, 264, 553 (1994) https://doi.org/10.1126/science.264.5158.553
- M. Beck, D. Hofstetter, T. Aellen, J. Faist, U. Oesterle, M. Ilegems, E. Gini, and H. Melchior, Science, 295, 301 (2002) https://doi.org/10.1126/science.1066408
- A. Evans, J. S. Yu, J. David, L. Doris, K. Mi, S. Slivken, and M. Razeghi, Appl. Phys. Lett. 84, 314 (2004) https://doi.org/10.1063/1.1641174
- H. Page, C. becker, A. Robertson, G. Glastre, V. Ortiz and C. Sirtori, Appl. Phys. Lett. 78, 3529 (2001) https://doi.org/10.1063/1.1374520
- 이혜진, Cheng Ming Lee, 한일기, 이정일, 김문덕, J. Kor. Vac. Soc. 16, 273 (2007) https://doi.org/10.5757/JKVS.2007.16.4.273
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