References
- Langis Michaud, Jean-Pierre Tchang, Celine Baril, and Jacques Gresset, 'New Perspectives in Monovision-A Study Comparing Aspheric With Disposable Lenses,' International Contact Lens Clinic, vol. 22, no. 90, pp. 203, 1995 https://doi.org/10.1016/0892-8967(95)00056-Z
- J. S Lee and K. Soyji, 'A study on ultra precision machining for aspherical surface of optical parts,' Journa of the Korean Society of precision Engineering, vol. 19, no. 10, pp. 195- 201, 2002
- E. S. Lee and S. Y. Back, 'A Study on optimum grinding factors for aspheric convex surface micro-lens using design of experiments,' International Journal of Machine tools & Manufacture, vol. 47, pp. 509-520, 2007 https://doi.org/10.1016/j.ijmachtools.2006.06.007
- 김상석, 김현욱, 정상화, 김혜정, 김정호, '레이저 빔 프린터용 F-Theta Lens 개발', 한국전기전자재료학회논문집, 19권, 4호, pp. 386, 2006 https://doi.org/10.4313/JKEM.2006.19.4.386
- 김현욱, 정상화, 박용필, 김상석, 김혜정, 김정호, '비구면 Glass 렌즈 성형용 초경합금(WC) 코어의 DLC 코팅 효과, 한국전기전자재료학회논문집, 19권, 11호, pp. 1050, 2006 https://doi.org/10.4313/JKEM.2006.19.11.1050
- H. Hanyu, S. Kamiya, Y. Murakami, and Y. Kondoh, 'The improvement of cutting performance in semi-dry condition by the combination of DLC coating and CVD smooth sorface diamond coating,' Surface and Coatings technology, vol. 200, no. 14, p. 1137, 2005 https://doi.org/10.1016/j.surfcoat.2005.02.022
- N. Alagumurthi, K. Palaniradja, and V. Soundararajan, 'Optimization of Grinding Process Through Design of Experiment (DOE),' Materials and Manufacturing Processes, vol. 21, no. 1, pp. 19, 2006 https://doi.org/10.1080/AMP-200060605
- N. Alagumurthi, K. Palaniradja, and V. Soundararajan, 'Optimization of Grinding Process Through Design of Experiment (DOE),' Materials and Manufacturing Processes, vol. 21, no. 1, pp. 19, 2006 https://doi.org/10.1080/AMP-200060605
- Technical Report of Nanotech Co. LTD, 'Introduce of Nanotech,' Nanotech Co. LTD, 2005
- Hideki Tsutsumi, Keiichi Yosizumi, and Hiroyuki Takeuchi, 'Presentation of Ultrahigh Accurate 3-D Profilometer and Case Examples of Measurement,' Presentation of Matsushita Electronic Industrial Co. LTD, 2002
- Keiichi Yoshizumi, Heishi Kubo, Hiroyuki Takeuchi, Koji Handa, and Takaaki Kassal, 'Ultra Accurate 3-D Profilometer Using Atomic Force Probe Measure Nanometer,' 情密工學會誌, vol. 68, no. 3, pp. 361, 2002