References
- W. Z. Zhu, S. C. Deevi, Mater. Sci. Eng., A348, 227-243 (2003) https://doi.org/10.1016/S0921-5093(02)00736-0
- J. W. Fergus, Solid State Ionics, 17, 11-15 (2004)
- H. Tu, U. Simming, J. Power Sources, 127, 284-293 (2004) https://doi.org/10.1016/j.jpowsour.2003.09.025
- Z. Yang, G. G. Xia, J. W. Stevenson, J. Power Sources, 160, 1104-1110 (2006) https://doi.org/10.1016/j.jpowsour.2006.02.099
- X. Chen, P.Y. Hou, C. P. Jacobson, S. J. Visco, L. C. De Jonghe, Solid State Ionics, 176, 425-433 (2005) https://doi.org/10.1016/j.ssi.2004.10.004
- W. Z. Zhu, S. C. Deevi, Mater. Res. Bullen, 38, 957-972 (2003) https://doi.org/10.1016/S0025-5408(03)00076-X
- Z. G. Yang, J. W. Stevenson and P. Singh, Adv. Mater. Process., 161, 34-37 (2003)
- J. H. Jun, S. G.Kim, N. W. Joo, D. H. Kim, J. H. Jun and G. C. Lee, RIST, 18, 108-116 (2004)
- J. W. Fergus, Mater. Sci. Eng., A397, 271-283 (2005) https://doi.org/10.1016/j.msea.2005.02.047
- T. Brylewski, M. Nanko, T. Maruyama, K. Przybylski, Solid State Ionics, 143, 131-150 (2001) https://doi.org/10.1016/S0167-2738(01)00863-3
- Z. Zeng, K. Natesan, Solid State Ionics, 167, 9-16 (2004) https://doi.org/10.1016/j.ssi.2003.11.026
- I. H. Oh, H. T. Son, S. H. Chang, H. M. Kim, K. Y. Lee, S. S. Park and H. Y. Song, J. Kor. Inst. Met. & Mater., 44(6), 441-445 (2006)
- Y. H. Yeom, Method of examination for materials, 82-83, Dongmyongsa, Korea (1996)
- N. Y. Shin,I. H. Oh, H. J. Lee, S. Y. Shin, H. H. Lee and B. T. Lee, J. Kor. Ceram. Soc., 41(4), 334-339 (2004) https://doi.org/10.4191/KCERS.2004.41.4.334