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Analysis of Electromagnetic Resonant Transmission through a Narrow Slit in Thick Conducting Screen

두께가 있는 도체 평판의 좁은 슬릿을 통한 전자기적 공진 투과 현상의 해석

  • Kwak, Seung-Soon (School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Park, Jong-Eon (School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University) ;
  • Ko, Ji-Whan (School of Electronic Eng., Kumoh National University of Technology) ;
  • Cho, Young-Ki (School of Electronic and Electrical Engineering and Computer Science, Kyungpook National University)
  • 곽승순 (경북대학교 전자전기컴퓨터공학부) ;
  • 박종언 (경북대학교 전자전기컴퓨터공학부) ;
  • 고지환 (금오공과대학교 전자공학부) ;
  • 조영기 (경북대학교 전자전기컴퓨터공학부)
  • Published : 2007.05.31

Abstract

The transmission resonance phenomenon through a narrow slit in the thick conducting screen is analyzed by use of the method of moments. In order to check the validity of this approach, some numerical results for the transmission coefficient is compared with previous ones. In particular, an approximate expression for the transmission width is derived in the analytical form.

도체 평판의 좁은 단일 슬릿 구조에서 슬릿을 통한 투과 공진 현상을 전자기학적인 관점에서 모멘트 방법으로 해석하고 투과계수에 대한 수치 결과를 기존의 결과와 비교 검토하였다. 특히 투과 폭(transmission width)에 대한 해석적인 근사 표현식이 유도되었다.

Keywords

References

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