Scanning Hall probe를 이용한 coated conductor의 field profile 측정과 current profile 계산

Measurements of the field profiles using scanning Hall probe and calculation of the current profiles of coated conductors

We measured the field profiles, H(x)'s of coated conductors by using scanning Hall probe method when various magnetic fields, $H{_\alpha}'s$ or currents, I's were applied. From the measured field profiles, we calculated the current profiles, J(x)'s by the inversion method. The calculated J(x)'s of coated conductors show some different properties from the standard critical state model. $J{_c}'s$ are inhomogeneous varying with the positions and are not constant when $H_{\alpha}$ or I changes. And when I decreases the features of current reversion are remarkably different from the model.