Ceramist (세라미스트)
- Volume 10 Issue 5
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- Pages.49-54
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- 2007
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- 1226-976X(pISSN)
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- 2586-0631(eISSN)
TEM Study on the Structural and Electrical Features of Grain Boundaries in Semiconducting Oxides
TEM을 이용한 산화물 반도체 입계의 구조 및 전기적 특성 평가
- Mun, Seon-Min (Department of Materials Science and Engineering, Inha University) ;
- Jo, Nam-Hui (Department of Materials Science and Engineering, Inha University) ;
- Park, Myeong-Beom (Semiconductor Business, Samsung Electronics)
- Published : 2007.10.31
Abstract
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