초록
This paper presents the friction induced scuffing and wear defects analysis of a pin bushing bearing based on the chemical composition using a scanning microscopy (SEM) and an energy dispersive X-ray analyzer (EDX). The SEM/EDX system, which may provide good information on the surface thermal defects and chemical compositions, provides impurities such as an aluminum, a silicon, a ferrous component and an oxygen, especially. The EDX measured results show that the oxygen may reduce the strength and a hardness of a pin busing, which may lead to a scuffing and a seizure on the rubbing contact surface. The current technology fabricated by a sintering for a pin bushing bearing should be modified or changed to reduce the oxygen composition and the impurities in pin bushing materials.