대한전기학회논문지:시스템및제어부문D (The Transactions of the Korean Institute of Electrical Engineers D)

대한전기학회 (The Korean Institute of Electrical Engineers)
권호 표지

시간-주파수 영역 반사파 계측방법을 이용한 부하 저항 측정 시스템 구현

The Implementation of Load Resistance Measurement System using Time-Frequency Domain Reflectometry

  • 발행 : 2006.10.01
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

One of the most important topics about the safety of electrical and electronic system is the reliability of the wiring system. The Time-Frequency Domain Reflectometry(TFDR) is a state-of-the-art system for detecting and estimating of the fault on a wiring. In this paper, We've considered the load resistance measurement on a coaxial cable using TFDR in a way of expanded application. The TFDR system was built using commercial Pci extensions for Instrumentation(PXI) and LabVIEW. The proposed real time TFDR system consisted of the reference signal design, signal generation, signal acquisition, algorithm execution and results display part. To implement real time system, all of the parts were programmed by the LabVIEW which is one of the graphical programming languages. Using the application software implemented by the LabVIEW, we were able to design a proper reference signal which is suitable for target cable and control not only the arbitrary waveform generator in the signal generation part but alto the digital storage oscilloscope in the signal acquisition part. By using the TFDR real time system with the terminal resistor on the target cable, we carried out load impedance measurement experiments. The experimental results showed that the proposed system are able not only to detect the location of impedance discontinuity on the cable but also to estimate the load resistance with high accuracy.

키워드

참고문헌

  1. Yamada, H. Ohmiya, M., Ogawa, Y. and Itoh, K., 'Superrsolution techniques for time-domain measurements with a network analyzer,' Antennas and IEEE Transactions on Propagation, Vol. 39, pp.177-183, Feb. 1991 https://doi.org/10.1109/8.68179
  2. Van Hamme, H., 'High-resolution frequency-domain reflectometry by estimation of modulated superimposed complex sinusoids,' IEEE Transactions on Instrmentation and Measurement, Vol. 41, pp. 762-767, Dec. 1992 https://doi.org/10.1109/19.199407
  3. Agrez, D., 'Approximation of the skin effect to improve cable-fault location by TDR,' Instrumentation and Measurement Technology conference 2003, Proceedings of the 20th IEEE, Vol. 1, p. 50-53, May 20-22, 2003
  4. Hewlett Packard, 'Time Domain Reflectometry,' Hewlett Packard, 1998
  5. Site Master, 'Transmission Line and Antenna Analyzer: Datasheet,' Anritsu, April 2000
  6. Shin, Y. J., Powers, E. J., Choe, T. S., Hong, C. Y., Song, E. S., Yook, J. G. and Park, J. B., 'Application of Time-Frequency Domain Reflectometry for Detection and Localization of a Fault on a Coaxial Cable,' IEEE Transactionson Instrmentation and Measuremen, Vol. 54, No. 6, Dec. 2005 https://doi.org/10.1109/TIM.2005.858115
  7. Choe, T. S., Hong, C. Y., Song, E. S., Yook, J. G., Park, J. B., Shin, Y. J. and Powers, E. J., 'Detection and Estimation of a Fault on Coaxical Cable via Time-Frequency Domain Reflectometry,' Proceedings of the 20th IEEE Instrument and Measurement Technology Conference 2003, Vol. 1, pp. 190-195, May 2003
  8. 최덕선, 곽기석, 윤태성, 박진배, '시간-주파수 반사파 계측 방법을 이용한 전송선로의 결함 위치 추정,' 대한전기학회논문지, 제54권 9호, pp. 521-530, 2005
  9. Textronix Inc. 'TDR Impedance Measurements: A Foundation for Signal Integrity,' 2001
  10. YongJune Shin, Edward J. Powers, William M. Grady and S. C. Bhatt, 'Cross Time-Frequency Distribution Function,' Advanced Signal Processing Alogorithms, Architectures, and Implementations X, Proceedings of SPIE, Vol. 4116, pp. 9-16, Nov. 2000 https://doi.org/10.1117/12.406504
  11. Gutterman, L., 'PXI: The Future of Test,' AUTOTESTCON Proceedings of the 21th IEEE IMTC 2004, Vol.2, pp.964-968, May 2004 https://doi.org/10.1109/AUTEST.2002.1047892
  12. Choe, T. S., Hong, C. Y., Park, J. B. and Yoon, T. S., 'Impementation of Time-Frequency Domain Reflectometry System with PXI Platform for a Coaxial Cable,' Proceedings of the 21th IEEE IMTC 2004, Vol.2, pp.964-968, May 2004 https://doi.org/10.1109/IMTC.2004.1351222
  13. ZTEC Inc. 'Model ZT500PXI Manual,' Jul., 2002
  14. ZTEC Inc. 'Model ZT430PXI Manual,' Dec., 2002.Stochastic Processes, 3rd Edition, New York: McGraw-Hill, 1991