Transactions on Electrical and Electronic Materials

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Comparison of Latin Hypercube Sampling and Simple Random Sampling Applied to Neural Network Modeling of HfO2 Thin Film Fabrication

  • Lee, Jung-Hwan (Department of Electrical and Electronics Engineering, Yonsei University) ;
  • Ko, Young-Don (Department of Electrical and Electronics Engineering, Yonsei University) ;
  • Yun, Il-Gu (Department of Electrical and Electronics Engineering, Yonsei University) ;
  • Han, Kyong-Hee (Center for the Innovation of Engineering Education, College of Engineering, Yonsei University)
  • Published : 2006.08.01
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Abstract

In this paper, two sampling methods which are Latin hypercube sampling (LHS) and simple random sampling were. compared to improve the modeling speed of neural network model. Sampling method was used to generate initial weights and bias set. Electrical characteristic data for $HfO_2$ thin film was used as modeling data. 10 initial parameter sets which are initial weights and bias sets were generated using LHS and simple random sampling, respectively. Modeling was performed with generated initial parameters and measured epoch number. The other network parameters were fixed. The iterative 20 minimum epoch numbers for LHS and simple random sampling were analyzed by nonparametric method because of their nonnormality.

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References

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