Applied Microscopy
- Volume 36 Issue spc1
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- Pages.63-69
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- 2006
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- 2287-5123(pISSN)
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- 2287-4445(eISSN)
Electron Holography of Advanced Nanomaterials
- Shindo, D. (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University) ;
- Park, H.S. (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University) ;
- Kim, J.J. (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University) ;
- Oikawa, T. (JEOL Ltd.) ;
- Tomita, T. (JEOL Ltd.)
- Published : 2006.06.30
Abstract
By utilizing a field emission gun and a biprism installed on a transmission electron microscope (TEM), electron holography is extensively carried out to visualize the electric and magnetic fields of nanomaterials. In the electric field analysis, the distribution of electric potential in a sharp tip made of W coated with