Electron Holography of Advanced Nanomaterials

  • Shindo, D. (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University) ;
  • Park, H.S. (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University) ;
  • Kim, J.J. (Institute of Multidisciplinary Research for Advanced Materials, Tohoku University) ;
  • Oikawa, T. (JEOL Ltd.) ;
  • Tomita, T. (JEOL Ltd.)
  • Published : 2006.06.30

Abstract

By utilizing a field emission gun and a biprism installed on a transmission electron microscope (TEM), electron holography is extensively carried out to visualize the electric and magnetic fields of nanomaterials. In the electric field analysis, the distribution of electric potential in a sharp tip made of W coated with $ZrO_2$ is visualized by applying the voltage to the tip. Denser contour lines due to the electric potential are observed with an increase in the bias voltage. In the magnetic field analysis by producing the strong magnetic field with a sharp magnetic needle made of a permanent magnet, the in situ experiment is carried out to investigate the magnetization of hard magnetic materials. The results of these experiments clearly demonstrate that electron holography is a promising advanced transmission electron microscopy technique to characterize the electric and magnetic properties of nanomaterials.

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