A method and analysis of human-error management of a semiconductor industry

반도체산업에서의 인적오류제어방법 및 연구

  • Published : 2006.02.01

Abstract

Basis frame-work's base in a semiconductor industry have gas, chemical, electricity and various facilities in bring to it. That it is a foundation by fire, power failure, blast, spill of toxicant huge by large size accident human and physical loss and damage because it can bring this efficient, connect with each kind mechanical, physical thing to prevent usefully need that control finding achievement factor of human factor of human action. Large size accident in a semiconductor industry to machine and human and it is involved that present, in system by safety interlock defect of machine is conclusion for error of behaviour. What is not construing in this study, do safety in a semiconductor industry to do improvement. Control human error analyzes in human control with and considers mechanical element and several elements. Also, apply achievement factor using O'conner Model by control method of human error. In analyze by failure mode effect using actuality example.

Keywords

References

  1. Harle, P.G. In vestigation of Human-Factors The link to accident prevention. In No Mcdonald & R.Fuller(Eds), Aviation Psychology inpractice pp 127-148, 1994
  2. Besco, R.O. "Modeling System Design Components of Pilot Error" Human-Error Aviodance Technigues Conference Procedings. pp 53-57, 1998
  3. 조영도, 박교식, 박희준, "화학공정산업의 인적오류 제어방법", KIGAS, Vol.7, No.2, pp 42-47, June 2003
  4. 2002년도 상반기 중대재해 원인 분석 pp17, "한국산업안전공단" 2002
  5. O' Connor, S.L., & Bacchi, M. A preliminary taxonomy for human error analysis in civil aircraft maintenance operation. Ninth Biennial Symposium of Aviation Psychology. 1997
  6. 2003년 환경안전 사고사레집 2003
  7. 2004년 환경안전 사고사례집 2004
  8. Sander's, M.S. & Mccormick, E.J. "Human Error, Accident and Safety. In Human Factor in Engineering and design(7th ed) 1993, pp 655-695 New York : Mcgraw-will, Inc. 1993
  9. Douglas A. Weigmann. "Human Error and Aviation Accident : A Umprehensivo, Fine-Grained Analysis Hsin HFACS" Final Technical Report AHFD-05-08 FFA-05-03, 99 16, 2005