References
- A. E. Dowrey and C. Marcott, Appl. Spectrosc., 36, 414(1982) https://doi.org/10.1366/0003702824639664
- M. J. Green, B. J. Barner and R. M. Corn, Rev. Sci. Instrum., 62, 1462(1991)
- M. J. Barner, M. J. Green, E. I. Saez and R. M. Corn, Anal. Chem., 63, 55(1991). https://doi.org/10.1021/ac00001a010
- R. V. Duevel and R. M. Corn, Anal. Chem., 64, 337(1992) https://doi.org/10.1021/ac00028a003
- B. L. Frey, D. G. Hanken and R. M. Corn, Langmuir, 9, 1815(1993) https://doi.org/10.1021/la00025a003
- C. E. Jordan, B. L. Frey, S. Kornguth and R. M. Corn, Langmuir, 10, 3642(1994) https://doi.org/10.1021/la00022a043
- B. Beden and C. Lamy, in Spectroelectrochemistry: Theory and Practice (R. J. Gale, ed.) Plenum Press, New York, 1988
- B. Beden, in Spectroscopic and Diffraction Techniques in Interfacial Electrochemistry (C. Gutierrez and C. Melendres, eds.), Kluwer Academy Publishers, Dordrecht, The Netherlands, p103, 1990
- S. M. Stole, D. D. Popenoe and M. D. Porter, in Electrochemical Interfaces: Modern Techniques for In-Situ Interface Characterization (H. D. Abruna, ed.), VCH, New York ch. 7(1991)
- R. M. Corn and D. A. Higgins, Chem. Rev., 94, 107(1994) https://doi.org/10.1021/cr00025a004
- R. M. Corn and D. A. Higgins, Characterization of Organic Thin Films, Buterworth-Heineman, 1995
- Y. R. Shen, in Spectroscopic and Diffraction Techniques in Interfacial Electrochemistry (C. Gutierrez and C. Melendres, eds.), Kluwer Academy Publishers, Dordrecht, The Netherlands, p281-311, 1990
- C. D. Bain, J. Chem. Soc. Faraday Trans., 91, 1281(1995) https://doi.org/10.1039/ft9959101281
- P. Guyot-Sionnest, R. Superfine, J. H. Hunt and Y. R. Shen, Chem. Phys. Lett., 144, 1(1988). https://doi.org/10.1016/0009-2614(88)87079-9
- T. H. Ong, R. N. Ward, P. B. Davies and C. D. Bain, J. Am. Chem. Soc., 114, 6243(1992) https://doi.org/10.1021/ja00041a051
- T. H. Ong, P. B. Davies and C. D. Bain, Langmuir, 9, 1836(1993) https://doi.org/10.1021/la00025a003
- D. M. Kolb, in Spectroelectrochemistry: Theory and Practice (R. J. Gale, ed.) Plenum Press, New York, ch. 4, 1988
- W. Plieth, in Spectroscopic and Diffraction Techniques in Interfacial Electrochemistry (C. Gutierrez and C. Melendres, eds.), Kluwer Academy Publishers, Dordrecht, The Netherlands, p223, 1990
- J. Pemberton, in Electrochemical Interfaces: Modern Techniques for In-Situ Interface Characterization (H. D. Abruna, ed.), VCH, New York, ch. 5, 1991
- R. K. Chang, in Spectroscopic and Diffraction Techniques in Interfacial Electrochemistry (C. Gutierrez and C. Melendres, eds.), Kluwer Academy Publishers, Dordrecht, The Netherlands, p155, 1990
- R. L. Brike and J. R. Lombardi, in Spectroelectrochemistry: Theory and Practice (R. J. Gale, ed.) Plenum Press, New York, ch. 6, 1988
- E. Burstein, W. P. Chen and A. Hartstein, J. Vac. Sci. Technol., 11, 1004(1974) https://doi.org/10.1116/1.1318673
- H. Raether, in Physics of Thin Films, Vol. 9, Academic Press, New York, p145(1977)
- V. M. Agranovich and D. L. Mills, eds., Surface Polaritons: Electromagnetic Waves at Surfaces and Interfaces, North-Holand, Amsterdam, 1982
- H. Knobloch, C. Duschl and W. knoll, J. Chem. Phys., 91, 3810(1989) https://doi.org/10.1063/1.456866
- H. Knobloch, H. Brunner, A. Leitner, F. Aussenegg and W. knoll, J. Chem. Phys., 98, 10093(1993) https://doi.org/10.1063/1.464398
- H. Kano and S. Kawata, Optics Lett., 21, 1848(1996) https://doi.org/10.1364/OL.21.001848
- S. Byahut and T. E. Furtak, Rev. Sci. Instrum., 61, 27-32(1990) https://doi.org/10.1063/1.1141321
- B. Pettinger, A. Tadjeddine and D. B. Kolb, Chem. Phys. Lett., 66, 544(1979) https://doi.org/10.1016/0009-2614(79)80357-7
- A. Girlando, M. R. Philpott, D. Heitmann, J. D. Swalen and R. Santo, J. Chem. Phys., 72, 5187(1980) https://doi.org/10.1063/1.439754
- W. Knoll, M. R. Philpott, J. D. Swalen and A. Girlando, J. Chem. Phys., 77, 2254 (1982) https://doi.org/10.1063/1.444147
- S. Ushioda and R. Loudon, in Surface Polaritons: Electromagnetic Waves at Surfaces and Interfaces, North-Holand, Amsterdam, p535, 1982
- S. Ushioda and Y. Sasaki, Phys. Rev. B, 27, 1401(1983) https://doi.org/10.1103/PhysRevB.27.1401
- R. M. Corn and M. R. Philpott, J. Chem. Phys., 80, 5245(1984) https://doi.org/10.1063/1.446595
- C. Duschl and W. Knoll, J. Chem. Phys., 88, 4062(1988) https://doi.org/10.1063/1.453860
- B. Rothenhausler, C. Duschl and W. Knoll, Thin Solid Films, 159, 323(1988) https://doi.org/10.1016/0040-6090(88)90628-1
- J. Giergiel, C. E. Reed, J. C. Hemminger and S. Ushioda, J. Phys. Chem., 92, 5357(1988) https://doi.org/10.1021/j100330a009
- W. Wittke, A. Hatta and A. Otto, Appl. Phys. A, 48, 289(1989) https://doi.org/10.1007/BF00619400
- M. G. Lee, L. H. Lee and J. S. Chang, Surf. Sci. Lett., 271, L362(1992) https://doi.org/10.1016/0039-6028(92)90891-9
- A. Nemetz, T. Fischer, A. Ulman and W. Knoll, J. Chem. Phys., 98, 5912(1993) https://doi.org/10.1063/1.464885
- M. Futamata, Langmuir, 11, 3894(1995) https://doi.org/10.1021/la00010a046
- M. Futamata, J. Chem. Phys., 99, 11901(1995)
- M. Futamata, E. Keim, A. Bruckbauer, D. Schumacher and A. Otto, Appl. Surf. Sci., 100/101, 60(1996) https://doi.org/10.1016/0169-4332(96)00257-7
- H. J. Simon, D. E. Mitchell and J. G. Watson, Phys. Rev. Lett., 33, 1531(1974) https://doi.org/10.1103/PhysRevLett.33.1531
- H. J. Simon, R. E. Benner and J. G. Rako, Opt. Commun., 23, 245(1977) https://doi.org/10.1016/0030-4018(77)90317-0
- F. DeMartini, P. Ristori, E. Santamato and A. C. A. Zammit, Phys. Rev. B, 8, 3797(1981)
- Y. R. Shen and F. DeMartini, in Surface Polaritons: Electromagnetic Waves at Surfaces and Interfaces, North-Holand, Amsterdam, p629, 1982
- J. E. Sipe and G. I. Stegeman, in Surface Polaritons: Electromagnetic Waves at Surfaces and Interfaces, North-Holand, Amsterdam, p661, 1982
- R. T. Deck and D. Sarid, J. Opt. Soc. Am., 72, 1613 (1982) https://doi.org/10.1364/JOSA.72.001613
- R. M. Corn, M. Romagnoli, M. D. Levenson and M. R. Philpott, Chem. Phys. Lett., 106, 30(1984) https://doi.org/10.1016/0009-2614(84)87006-2
- H. Raether, Surface Plasmons on Smooth and Rough Surface and on Gratings, Springer, Berlin, 1998
- J. Homola, S. S. Yee and G. Gauglitz, Sens. Actuat. B, 54, 3 (1999) https://doi.org/10.1016/S0925-4005(98)00321-9
- E. Stenberg, B. Persson, H. Roos and C. Urbaniczky, J. Colloid. Interf. Sci., 143, 513 (1991) https://doi.org/10.1016/0021-9797(91)90284-F
- A. N. Naimushin, S. D. Soelberg, D. K. Nguyen, L. Dunlap, D. Bartholomew, J. Elkind, J. Melendez, and C. E. Furlong, Biosens. Bioelectron., 17, 573 (2002) https://doi.org/10.1016/S0956-5663(02)00014-3
- X. Cui, R. Pei, Z. Wang, F. Yang, Y. Ma, S. Dong, and X. Yang, Biosens. Bioelectron., 18, 59 (2003) https://doi.org/10.1016/S0956-5663(02)00114-8
- S. L. McGurk, M. C. Davies, C. J. Roberts, S. J. B. Tendler and P. M. Williams, J. Colloid. Interf. Sci., 218, 456 (1999) https://doi.org/10.1006/jcis.1999.6435
- B. P. Nelson, T. E. Grimsrud, M. R. Lies, R. M. Goodman and R. Corn, Anal. Chem., 73, 1 (2001) https://doi.org/10.1021/ac0010431
- V. Silin, H. Weetall and D. J. Vanderah, J. Colloid. Interf. Sci., 185, 94 (1997) https://doi.org/10.1006/jcis.1996.4586
- H. J. Watts, D. Yeung and H. Parkers, Anal. Chem., 67, 4283 (1995) https://doi.org/10.1021/ac00119a013
- N. S. Eun, S. H. Lee, D. R. Lee, D. K. Kwon, J. K. Shin, J. H. Kim and S. W. Kang, Sens. Actuat. B, 96, 446 (2003) https://doi.org/10.1016/S0925-4005(03)00599-9
- L. M. May and D. A. Russell, Anal. Chim. Acta, 500, 119 (2003) https://doi.org/10.1016/S0003-2670(03)00943-7
- J. C. C. Yu, E. P. C. Lai and S. Sadeghi, Sens. Actuat. B, 101, 236 (2004) https://doi.org/10.1016/j.snb.2004.03.007
- S. Chah, J. Yi and R. N. Zare, Sens. Actuat. B, 101, 446 (2004)
- K. V. Gobi, M. Sasaki, Y. Shoyama and N. Miura, Sens. Actuat. B, 89, 137 (2003) https://doi.org/10.1016/S0925-4005(02)00401-X
- K. V. Gobi and N. Miura, Sens. Actuat. B, 103, 265 (2004) https://doi.org/10.1016/j.snb.2004.04.076