Journal of the Korean Data and Information Science Society

한국데이터정보과학회 (The Korean Data and Information Science Society)
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An Operating Methodology of SPC System in LCD Industries

  • 발행 : 2005.08.31
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초록

In this paper we consider an operating methodology of SPC(statistical process control) system in the TFT-LCD industries. The main contents are real time process monitoring, significant difference test, outlying glass analysis, process capability analysis and chart viewing.

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참고문헌

  1. Applied Nonparametric Statistics Daniel, W.W.
  2. Probability and Statistics for Engineering and the Sciences Devore, Jay L.
  3. IEMS Spring Conference Feature Selection Methodology in Quality Data Mining Nam, H.S.;Yulius, H.
  4. IEMS Spring Conference A Use of Significant Difference Test in Equipment Management Joo, C.M.;Nam, H.S.;Jung, H.S.
  5. STATISTICA System Reference