Acceleration Test of Ion Migration for PCB Electronic Reliability Evaluation

PCB 전기적 신뢰성평가를 위한 이온 마이그레이션 가속시험

  • 이덕보 (한양대학교 신뢰성분석연구센터) ;
  • 김정현 (한양대학교 신뢰성분석연구센터) ;
  • 강수근 (한양대학교 신뢰성분석연구센터) ;
  • 장석원 (한양대학교 신뢰성분석연구센터) ;
  • 임재훈 (삼성전자 냉장고 CS Group) ;
  • 유동수 (삼성전자 냉장고 CS Group)
  • Published : 2005.02.28


In evaluation of electronic reliability on the PCB(Print Circuit Borad),electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs in the environment of the hight humidity and the hight temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity of electrochemical migration depended on electrolyte quantity which included in the various waters.